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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| 5991-4631EN Wafer-level Measurement Solutions - Overview c20140814 [2].pdf | 5991-4631EN Wafer-level Measurement Solutions - Overview c20140814 [2].pdf | 29/08/20 | Wafer-Level Measurement Solutions Keysig | 354 kB | 1 | Agilent | 5991-4631EN Wafer-level Measurement Solutions - Overview c20140814 [2] |
| 5991-4494EN Wafer-level Measurement Solutions - Component Measurements c20140814 [2].pdf | 5991-4494EN Wafer-level Measurement Solutions - Component Measurements c20140814 [2].pdf | 30/08/20 | Wafer-Level Component Measurement Keysig | 738 kB | 1 | Agilent | 5991-4494EN Wafer-level Measurement Solutions - Component Measurements c20140814 [2] |
| 5991-4460EN WaferPro Express Software - Brochure c20141015 [11].pdf | 5991-4460EN WaferPro Express Software - Brochure c20141015 [11].pdf | 31/08/20 | Keysight Technologies WaferPro Express S | 791 kB | 1 | Agilent | 5991-4460EN WaferPro Express Software - Brochure c20141015 [11] |
| Katalog 2011 2012.pdf | Katalog 2011 2012.pdf | 16/03/20 | Test & Measurement Catalog 2011/12 | 45379 kB | 2 | HP | Katalog 2011 2012 |
| 4711-1,0.pdf | 4711-1,0.pdf | 20/07/21 | A G R E A T E R M E A S U | 1129 kB | 2 | Keithley | 4711-1,0 |
| 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24].pdf | 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24].pdf | 30/08/20 | Keysight Technologies Phase Noise Measur | 4225 kB | 3 | Agilent | 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24] |
| On-Wafer Parametric Measurement 4-On-Wafer_Parametric_Measurement c20130117 [1].pdf | On-Wafer Parametric Measurement 4-On-Wafer_Parametric_Measurement c20130117 [1].pdf | 05/01/20 | Excerpt Edition This PDF is an excerpt f | 717 kB | 3 | Agilent | On-Wafer Parametric Measurement 4-On-Wafer Parametric Measurement c20130117 [1] |
| Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 599 | Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 599 | 23/08/21 | Keysight Technologies Solutions for Achi | 567 kB | 4 | Agilent | Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 599 |
| E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6].pdf | E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6].pdf | 09/08/21 | Keysight Technologies E5500 Series Phase | 557 kB | 1 | Agilent | E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6] |
| 4200_SCS_HCI_DS.pdf | 4200_SCS_HCI_DS.pdf | 14/03/20 | 4200-SCS H | 325 kB | 2 | Keithley | 4200 SCS HCI DS |
| 2868 Nanomix.pdf | 2868 Nanomix.pdf | 05/03/20 | A | 944 kB | 0 | Keithley | 2868 Nanomix |
| 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 15/09/21 | Keysight Technologies Solutions for Meas | 718 kB | 4 | Agilent | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers |
| 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 19/08/21 | Keysight Technologies Measuring Dielectr | 525 kB | 2 | Agilent | 5991-2171EN Measuring Dielectric Properties using Keysight 2527s Materials Measurement Solutions - B |
| a-134.pdf | a-134.pdf | 04/03/20 | ON-WAFER MEASUREMENTS WI | 8695 kB | 3 | HP | a-134 |
| a-133.pdf | a-133.pdf | 27/02/20 | 40 GHz ON-WAFER MEASUREMENTS | 6355 kB | 3 | HP | a-133 |
| MW catalog 2.pdf | MW catalog 2.pdf | 15/01/20 | Agilent RF and Microwave Test Accessorie | 6383 kB | 2 | HP | MW catalog 2 |
| irg4cc10sb.pdf | irg4cc10sb.pdf | 24/11/21 | 42 kB | 0 | International Rectifier | irg4cc10sb | |
| 5980-2862EN.pdf | 5980-2862EN.pdf | 22/03/20 | Agilent Solutions for Measuring Permitti | 1536 kB | 3 | HP | 5980-2862EN |
| 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12].pdf | 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12].pdf | 04/12/21 | Keysight Technologies Pulsed-IV Parametr | 645 kB | 1 | Agilent | 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12] |
| irg4cc50sb.pdf | irg4cc50sb.pdf | 31/10/21 | 40 kB | 0 | International Rectifier | irg4cc50sb | |