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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| Electric Wave Absorber (Material)_252C Return Loss Measurement System Lens Antenna Method_252C Diago | Electric Wave Absorber (Material)_252C Return Loss Measurement System Lens Antenna Method_252C Diago | 08/09/21 | Keysight Technologies and KEYCOM Corp. E | 762 kB | 2 | Agilent | Electric Wave Absorber (Material) 252C Return Loss Measurement System Lens Antenna Method 252C Diago |
| 11410-00276.pdf | 11410-00276.pdf | 29/02/20 | APPLICATION NOTE Insertion Loss Me | 4291 kB | 0 | Anritsu | 11410-00276 |
| 5980-2862EN.pdf | 5980-2862EN.pdf | 22/03/20 | Agilent Solutions for Measuring Permitti | 1536 kB | 3 | HP | 5980-2862EN |
| 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 15/09/21 | Keysight Technologies Solutions for Meas | 718 kB | 4 | Agilent | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers |
| English _ 2013-05-16 _ PDF 3.59 MB 5991-2061EN c20140811 [7].pdf | English _ 2013-05-16 _ PDF 3.59 MB 5991-2061EN c20140811 [7].pdf | 29/08/20 | Keysight Technologies Low Frequency RFID | 4280 kB | 1 | Agilent | English 2013-05-16 PDF 3.59 MB 5991-2061EN c20140811 [7] |
| Making Reflection Measurements - Application Note 5991-2082EN c20140726 [9].pdf | Making Reflection Measurements - Application Note 5991-2082EN c20140726 [9].pdf | 22/09/19 | Keysight Technologies Making Reflection | 2615 kB | 2 | Agilent | Making Reflection Measurements - Application Note 5991-2082EN c20140726 [9] |
| KX-FP207.part01.rar | 06_11_01.pdf | 29/11/07 | Block Diagram AC Input G + - Input Circ | 2246 kB | 1241 | PANASONIC | KX-FP207 |
| KX-FT938.part1.rar | 08_12_01.pdf | 27/11/07 | Block Diagram AC Input Input Circuit R | 2246 kB | 1838 | PANASONIC | KX-FT938 |
| KX-FT902.part1.rar | 08_13_01.pdf | 28/11/07 | Block Diagram AC Input G + - Input Circ | 2246 kB | 1980 | PANASONIC | KX-FT902 |
| KX-FL613.part01.rar | 07_16_01.pdf | 28/11/07 | Block Diagram AC Input CN101 T101 Input | 2246 kB | 4463 | PANASONIC | KX-FL613 |
| 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 13/08/21 | Keysight Technologies Materials Measurem | 935 kB | 1 | Agilent | 5991-4713EN Materials Measurement Dielectric Materials - Application Brief c20140717 [5] |
| 5988-0200EN.pdf | 5988-0200EN.pdf | 27/02/20 | Agilent New Generation Analyzer Offers E | 1383 kB | 0 | HP | 5988-0200EN |
| Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | 12/10/21 | 1015 kB | 3 | Agilent | Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | |
| 5991-4714EN Materials Measurement_ Magnetic Materials - Application Brief c20140717 [5].pdf | 5991-4714EN Materials Measurement_ Magnetic Materials - Application Brief c20140717 [5].pdf | 22/11/21 | Keysight Technologies Materials Measurem | 1114 kB | 1 | Agilent | 5991-4714EN Materials Measurement Magnetic Materials - Application Brief c20140717 [5] |
| 86205A B & 86207A 50 Ohm & 75 Ohm RF Bridges - Data Sheet 5091-3117E c20140612 [5].pdf | 86205A B & 86207A 50 Ohm & 75 Ohm RF Bridges - Data Sheet 5091-3117E c20140612 [5].pdf | 25/08/20 | Keysight 86205A/B & 86207A 50 & 75 Bri | 680 kB | 1 | Agilent | 86205A B & 86207A 50 Ohm & 75 Ohm RF Bridges - Data Sheet 5091-3117E c20140612 [5] |
| 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf | 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf | 31/08/20 | Keysight Technologies Basics of Measurin | 2840 kB | 1 | Agilent | 5989-2589EN English 2014-05-16 PDF 3.32 MB c20140728 [34] |
| Capacitance Method_252CFlat Plate_252C Liquid_252C Gel_252C Ultra Thin Film_252C Compound Film_252CD | Capacitance Method_252CFlat Plate_252C Liquid_252C Gel_252C Ultra Thin Film_252C Compound Film_252CD | 04/10/21 | 970 kB | 3 | Agilent | Capacitance Method 252CFlat Plate 252C Liquid 252C Gel 252C Ultra Thin Film 252C Compound Film 252CD | |
| Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- | 26/07/21 | Keysight Technologies and KEYCOM Corp. P | 1389 kB | 4 | Agilent | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- |
| Selector_Opto.pdf | Selector_Opto.pdf | 25/02/20 | 95 kB | 0 | Keithley | Selector Opto | |
| RGLNA06(2-6 GHz,3.3 V GaAs pHEMT).pdf | RGLNA06(2-6 GHz,3.3 V GaAs pHEMT).pdf | 13/02/08 | RFIC Solutions Inc. Low Noise Amplifier | 54 kB | 78 | Rficsolutions.Inc | RGLNA06 |