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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| Noise Parameter vs Noise Figure Measurements 5990-4463EN c20140812 [3].pdf | Noise Parameter vs Noise Figure Measurements 5990-4463EN c20140812 [3].pdf | 30/08/20 | Noise Parameter vs Noise Figure Measurem | 1052 kB | 6 | Agilent | Noise Parameter vs Noise Figure Measurements 5990-4463EN c20140812 [3] |
| 5980-0163E NFA Series Noise Figure Analyzer - Configuration Guide c20140826 [8].pdf | 5980-0163E NFA Series Noise Figure Analyzer - Configuration Guide c20140826 [8].pdf | 28/08/20 | Keysight Technologies NFA Noise Figure A | 742 kB | 6 | Agilent | 5980-0163E NFA Series Noise Figure Analyzer - Configuration Guide c20140826 [8] |
| Noise Figure Selection Guide Minimizing the Uncertainties - Selection Guide 5989-8056EN c20140214 [2 | Noise Figure Selection Guide Minimizing the Uncertainties - Selection Guide 5989-8056EN c20140214 [2 | 15/12/21 | Noise Figure Selection Guide | 5793 kB | 1 | Agilent | Noise Figure Selection Guide Minimizing the Uncertainties - Selection Guide 5989-8056EN c20140214 [2 |
| PSA Series Noise Figure Measurement Personality Option 219 - Technical Overview 5988-7884EN c2013112 | PSA Series Noise Figure Measurement Personality Option 219 - Technical Overview 5988-7884EN c2013112 | 24/06/21 | Agilent | 2253 kB | 3 | Agilent | PSA Series Noise Figure Measurement Personality Option 219 - Technical Overview 5988-7884EN c2013112 |
| 5988-3217EN Noise Figure Measurements - Course Overview c20140811 [3].pdf | 5988-3217EN Noise Figure Measurements - Course Overview c20140811 [3].pdf | 29/08/20 | Keysight Technologies Noise Figure | 124 kB | 1 | Agilent | 5988-3217EN Noise Figure Measurements - Course Overview c20140811 [3] |
| 5980-1916E.pdf | 5980-1916E.pdf | 18/02/20 | Practical Noise-Figure Measurement and A | 1694 kB | 3 | HP | 5980-1916E |
| 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 | 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 | 01/07/21 | Keysight Technologies Optimizing On-Wafe | 2563 kB | 1 | Agilent | 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 |
| 5989-0270EN.pdf | 5989-0270EN.pdf | 17/12/19 | Non-Zero Noise Figure After Calibration | 94 kB | 0 | HP | 5989-0270EN |
| a-110.pdf | a-110.pdf | 22/09/19 | HP Archive This vintage | 1509 kB | 4 | HP | a-110 |
| an_1303.pdf | an_1303.pdf | 22/02/20 | Spectrum Analyzer Measurements and Noise | 429 kB | 0 | HP | an 1303 |
| 5980-0288E.pdf | 5980-0288E.pdf | 27/11/19 | 10 Hints for Making Succ | 2078 kB | 1 | HP | 5980-0288E |
| Sales_Brief_201X_Capabilities.pdf | Sales_Brief_201X_Capabilities.pdf | 03/03/20 | Models 2015, 2015-P, 2016 Sales Brief | 59 kB | 7 | Keithley | Sales Brief 201X Capabilities |
| 1958-01.pdf | 1958-01.pdf | 27/08/20 | 2114 kB | 1 | Agilent | 1958-01 | |
| 5988-0081EN N4000A_252C N4001A_252C N4002A SNS Series Noise Sources - Technical Overview c20140730 [ | 5988-0081EN N4000A_252C N4001A_252C N4002A SNS Series Noise Sources - Technical Overview c20140730 [ | 30/08/21 | Keysight Technologies N4000A, N4001A, N4 | 1988 kB | 2 | Agilent | 5988-0081EN N4000A 252C N4001A 252C N4002A SNS Series Noise Sources - Technical Overview c20140730 [ |
| 5966-4008E.pdf | 5966-4008E.pdf | 27/01/20 | 2110 kB | 5 | HP | 5966-4008E | |
| a-201.pdf | a-201.pdf | 22/12/19 | Accuracy of Noise Figure Measurement Sy | 2438 kB | 5 | HP | a-201 |
| 1132_Low_Voltage_AN.pdf | 1132_Low_Voltage_AN.pdf | 02/03/20 | 27 kB | 5 | Keithley | 1132 Low Voltage AN | |
| 2182A.pdf | 2182A.pdf | 20/03/20 | 2182a N | 565 kB | 0 | Keithley | 2182A |
| RTLNA01.pdf | RTLNA01.pdf | 12/02/08 | RFIC Solutions Inc. Low Noise Amplifier | 61 kB | 109 | Rficsolutions Inc. | RTLNA01 |
| 5952-8255E.pdf | 5952-8255E.pdf | 27/02/20 | Agilent Fundamentals of RF and Microwave | 864 kB | 2 | HP | 5952-8255E |