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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- | 26/07/21 | Keysight Technologies and KEYCOM Corp. P | 1389 kB | 4 | Agilent | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- |
| 5980-2862EN.pdf | 5980-2862EN.pdf | 22/03/20 | Agilent Solutions for Measuring Permitti | 1536 kB | 3 | HP | 5980-2862EN |
| 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 15/09/21 | Keysight Technologies Solutions for Meas | 718 kB | 4 | Agilent | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers |
| Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | 12/10/21 | 1015 kB | 3 | Agilent | Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | |
| Capacitance Method_252CFlat Plate_252C Liquid_252C Gel_252C Ultra Thin Film_252C Compound Film_252CD | Capacitance Method_252CFlat Plate_252C Liquid_252C Gel_252C Ultra Thin Film_252C Compound Film_252CD | 04/10/21 | 970 kB | 3 | Agilent | Capacitance Method 252CFlat Plate 252C Liquid 252C Gel 252C Ultra Thin Film 252C Compound Film 252CD | |
| 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 13/08/21 | Keysight Technologies Materials Measurem | 935 kB | 1 | Agilent | 5991-4713EN Materials Measurement Dielectric Materials - Application Brief c20140717 [5] |
| 5991-4715EN English _ 2014-08-27 _ PDF 227 KB c20141007 [4].pdf | 5991-4715EN English _ 2014-08-27 _ PDF 227 KB c20141007 [4].pdf | 24/12/19 | Keysight Technologies Materials Measurem | 227 kB | 2 | Agilent | 5991-4715EN English 2014-08-27 PDF 227 KB c20141007 [4] |
| 5990-9813EN Millimeter-Wave Spectrum Analysis c20140813 [2].pdf | 5990-9813EN Millimeter-Wave Spectrum Analysis c20140813 [2].pdf | 28/08/20 | Millimeter-Wave Spectrum Analysis Keysig | 570 kB | 1 | Agilent | 5990-9813EN Millimeter-Wave Spectrum Analysis c20140813 [2] |
| 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19].pdf | 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19].pdf | 31/08/20 | Keysight Technologies Paving the Way for | 1038 kB | 1 | Agilent | 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19] |
| 5991-4739EN Materials Measurement_ Liquid Materials - Application Brief c20140805 [6].pdf | 5991-4739EN Materials Measurement_ Liquid Materials - Application Brief c20140805 [6].pdf | 28/08/20 | Keysight Technologies Materials Measurem | 1274 kB | 2 | Agilent | 5991-4739EN Materials Measurement Liquid Materials - Application Brief c20140805 [6] |
| a-142.pdf | a-142.pdf | 01/01/20 | MEASUREMENT CONSIDERATIONS | 12145 kB | 11 | HP | a-142 |
| Stone [polymer smd] PVM Series.pdf | Stone [polymer smd] PVM Series.pdf | 17/05/21 | ALUMINUM ELECTROLYTIC CAPACITORS WITH CO | 414 kB | 2 | Stone | [polymer smd] PVM Series |
| Stone [polymer smd] PVX Series.pdf | Stone [polymer smd] PVX Series.pdf | 29/11/21 | ALUMINUM ELECTROLYTIC CAPACITORS WITH CO | 412 kB | 13 | Stone | [polymer smd] PVX Series |
| Electric Wave Absorber (Material)_252C Return Loss Measurement System Lens Antenna Method_252C Diago | Electric Wave Absorber (Material)_252C Return Loss Measurement System Lens Antenna Method_252C Diago | 08/09/21 | Keysight Technologies and KEYCOM Corp. E | 762 kB | 2 | Agilent | Electric Wave Absorber (Material) 252C Return Loss Measurement System Lens Antenna Method 252C Diago |
| 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf | 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf | 31/08/20 | Keysight Technologies Basics of Measurin | 2840 kB | 1 | Agilent | 5989-2589EN English 2014-05-16 PDF 3.32 MB c20140728 [34] |
| a-128.pdf | a-128.pdf | 07/03/20 | AUTOMATED VECTOR NETWORK ANA | 5294 kB | 8 | HP | a-128 |
| a-209.pdf | a-209.pdf | 15/03/20 | ON-WAFER MILLIMETER- | 996 kB | 0 | HP | a-209 |
| 5989-7620EN Millimeter-Wave Network Analyzers 10 MHz to 110 GHz_252C with Extensions to 1.1 THz - Te | 5989-7620EN Millimeter-Wave Network Analyzers 10 MHz to 110 GHz_252C with Extensions to 1.1 THz - Te | 30/05/21 | Keysight Technologies Millimeter-Wave Ne | 4326 kB | 2 | Agilent | 5989-7620EN Millimeter-Wave Network Analyzers 10 MHz to 110 GHz 252C with Extensions to 1.1 THz - Te |
| 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 19/08/21 | Keysight Technologies Measuring Dielectr | 525 kB | 2 | Agilent | 5991-2171EN Measuring Dielectric Properties using Keysight 2527s Materials Measurement Solutions - B |
| N5256-90001 N5256 57 58A Millimeter-Wave Modules User_2527s and Service Guide [32].pdf | N5256-90001 N5256 57 58A Millimeter-Wave Modules User_2527s and Service Guide [32].pdf | 29/08/20 | Keysight Technologies | 318 kB | 1 | Agilent | N5256-90001 N5256 57 58A Millimeter-Wave Modules User 2527s and Service Guide [32] |