| 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 | | Keysight 5600LS AFM
Surface Potential Measurements
Using Keysight 7500 AFM
Application Brief
Introduction cantilever, respectively. lows the Keysight 7500 AFM to perform
single-pass KFM measurements by ap-
Scanning kelvin force microscopy (KFM) The force component at 2v is proportion- plying dual-frequency excitation signals
has been widely used in mapping surface al to dC/dZ. Therefore, by mapping the to the AFM tip simultaneously. One
potential (SP) distribution at the na- F2v response one can get spatial varia- excitation signal is used for modulating
noscale. The principle of KFM is based on tions of local dielectric behavior. In other the mechanical oscillation of the AFM tip
the measurement of electrostatic forces words, KFM can provide an advanced and for topography imaging. The seco |
