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Now downloading free:Agilent 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020


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5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 Keysight 5600LS AFM Surface Potential Measurements Using Keysight 7500 AFM Application Brief Introduction cantilever, respectively. lows the Keysight 7500 AFM to perform single-pass KFM measurements by ap- Scanning kelvin force microscopy (KFM) The force component at 2v is proportion- plying dual-frequency excitation signals has been widely used in mapping surface al to dC/dZ. Therefore, by mapping the to the AFM tip simultaneously. One potential (SP) distribution at the na- F2v response one can get spatial varia- excitation signal is used for modulating noscale. The principle of KFM is based on tions of local dielectric behavior. In other the mechanical oscillation of the AFM tip the measurement of electrostatic forces words, KFM can provide an advanced and for topography imaging. The seco



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