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Now downloading free:Agilent Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note 5991-3739EN c20140625 [17


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File name:Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note 5991-3739EN c20140625 [17
[preview Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note 5991-3739EN c20140625 [17]
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Using Fast-Sweep Techniques to Accelerate Spur Searches - Application Note 5991-3739EN c20140625 [17Keysight Technologies Using Fast-Sweep Techniques to Accelerate Spur Searches Application Note Introduction Measurement speed is a major issue for a wide variety of RF and microwave products, and this influences production costs in industries ranging from commercial wireless to aerospace and defense. As a result, manufacturers in these areas are looking for ways to shorten design cycles, reduce manufacturing costs and increase yield. One important opportunity for improvement is the search for spurious emissions. These tests can be especially difficult and time-consuming because measurements must be made over wide frequency ranges and with high sensitivity. Unlike measurements of har- monics, the locations of spurious signals are not accurately known beforehand and there is often no choice but to sweep across wide frequency spans using narrow resolution



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