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Now downloading free:Agilent Jitter Analysis Using Keysight 2527s InfiniiVision 6000 X-Series and Infiniium Series - Application


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Descr: Agilent Jitter Analysis Using Keysight_2527s InfiniiVision 6000 X-Series and Infiniium Series - Application Note 5991-4000EN c20140915 [13].pdf
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Jitter Analysis Using Keysight_2527s InfiniiVision 6000 X-Series and Infiniium Series - Application Keysight Technologies Jitter Analysis Using InfiniiVision 6000 X-Series and Infiniium Series Oscilloscopes Application Note Introduction As data rates continue to increase in today's state-of-the-art high-speed digital designs, timing budgets are decreasing. Ensuring that serial data signals are valid and stable when receivers sample the data often requires an understanding of the effects of the various components of jitter that may contribute to decreased valid data windows. The primary measurement tool used today by hardware design engineers to capture and view waveform jitter is an oscilloscope. Many of today's higher performance oscilloscopes also provide optional jitter analysis measurement capabilities that can not only be used to view jitter in different display formats, but they can also quantize the various components of jitter. This application note begins with a discussion of various display



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