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Now downloading free:Agilent 5600LS AFM Enhanced Sample Versatility 2-Inch Multi-Sample Wafer Vacuum Chuck 5991-2015EN c20140723  [report bad file]  

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5600LS AFM Enhanced Sample Versatility_ 2-Inch Multi-Sample Wafer Vacuum Chuck 5991-2015EN c20140723Keysight 5600LS AFM Enhanced Sample Versatility: 2-Inch Multi-Sample Wafer Vacuum Chuck The Keysight Technologies, Inc. 5600 LS AFM, already one of the most versatile atomic force microscopy systems on the market (with a fully programmable 200 mm stage that allows complete access over a full 200 mm in X/Y travel), has added yet another highly useful configuration. A new 2" (52 mm) multi-sample wafer vacuum chuck can now be added to the Keysight 5600 LS AFM, providing system users the ability to image up to one dozen 2" wafers. Important to the growing LED market (e.g., GaN devices on sapphire substrates) and to a variety of optoelectronics devices on InP and GaAs wafers, this multi-sample wafer vacuum chuck option allows unattended automation of imaging and measuring up to 12 samples. Ideal for process development and monitoring, the Keysight 5600 LS AFM has a high-precision 200 mm X/Y stage and built-in automation to create complex automated imaging on multiple samples. Whether y

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