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| File | Date | Descr | Size | Popular | Mfg | Model |
| Jensen Discharging An Insulator Surface By Secondary Emission Without Redistribution Jun55 : Full Text Matches - Check >> | ||||||
| Found in: original (1) | ||||||
| Jensen_Discharging_An_Insulator_Surface_By_Secondary_Emission_Without_Redistribution_Jun55.pdf | 05/11/21 | RCA storage_tubes Jensen_Discharging_An_Insulator_Surface_By_Secondary_Emission_Without_Redistribution_Jun55.pdf | 1128 kB | 4 | RCA | Jensen Discharging An Insulator Surface By Secondary Emission Without Redistribution Jun55 |
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| Jensen_The_Radechon_A_Barrier_Grid_Storage_Tube_Jun55.pdf | 13/02/20 | RCA storage_tubes Jensen_The_Radechon_A_Barrier_Grid_Storage_Tube_Jun55.pdf | 1415 kB | 6 | RCA | Jensen The Radechon A Barrier Grid Storage Tube Jun55 |
| Jensen-AS031 preamp.pdf | 06/01/10 | preamp | 18 kB | 565 | Jensen | AS301 |
| 140 Schematics (Secondary).pdf | 28/12/20 | . Various SM scena DBX 140 Schematics (Secondary).pdf | 139 kB | 0 | . Various | 140 Schematics (Secondary) |
| Surface Mount Type Packaging Specification (E_SMD_PACKAGING_080820).pdf | 11/12/21 | . Electronic Components Datasheets Passive components capacitors CDD H Hitano Surface Mount Type Packaging Specification (E_SMD_PACKAGING_080820).pdf | 67 kB | 0 | Hitano | Surface Mount Type Packaging Specification (E SMD PACKAGING 080820) |
| Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission | 06/06/21 | Agilent Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission 5991-2414EN c20130503 [12].pdf | 987 kB | 1 | Agilent | Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission |
| pcb254175-001-rev01-secondary-layer4 Foto pci (DSP) .pdf | 17/01/20 | BOSE Audio PS18 PS28 PS48 pcb254175-001-rev01-secondary-layer4 Foto pci (DSP) .pdf | 324 kB | 49 | BOSE | pcb254175-001-rev01-secondary-layer4 Foto pci (DSP) |
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| 5991-0781EN Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Applicati | 02/12/21 | Agilent 5991-0781EN Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note c20140929 [8].pdf | 692 kB | 1 | Agilent | 5991-0781EN Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Applicati |
| Surface_Mount.pdf | 17/06/20 | . Electronic Components Datasheets Passive components capacitors Samwha Surface_Mount.pdf | 1837 kB | 2 | Samwha | Surface Mount |
| Secondary Radar Transponder Testing Using the 8990B Peak Power Analyzer - Application Note 5991-1192 | 14/11/21 | Agilent Secondary Radar Transponder Testing Using the 8990B Peak Power Analyzer - Application Note 5991-1192EN c20121203 [10].pdf | 615 kB | 1 | Agilent | Secondary Radar Transponder Testing Using the 8990B Peak Power Analyzer - Application Note 5991-1192 |
| 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Appl | 15/06/21 | Agilent 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note c20141020 [4].pdf | 467 kB | 3 | Agilent | 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Appl |
| the_surface_mount_device_code_book.pdf | 08/09/22 | CANON Copiers PC 1000s_1200s_1210_iR1200s pc1200s the_surface_mount_device_code_book.pdf | 1396 kB | 2 | CANON | the surface mount device code book |
| 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Applicati | 29/09/21 | Agilent 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note c20141020 [2].pdf | 117 kB | 2 | Agilent | 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Applicati |
| MC88410_Secondary_Cache_Controller_Users_Manual_1992.pdf | 26/11/20 | motorola 88000 MC88410_Secondary_Cache_Controller_Users_Manual_1992.pdf | 13171 kB | 0 | motorola | MC88410 Secondary Cache Controller Users Manual 1992 |
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| 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 | 14/06/21 | Agilent 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 [4].pdf | 964 kB | 1 | Agilent | 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 |
| DU01A_1410_7010_1302-1302_Surface_Reinitialize_and_Flag_Log_Utility.PDF | 27/10/21 | IBM 1410 diagnostics DIAGV600 DU01A_1410_7010_1302-1302_Surface_Reinitialize_and_Flag_Log_Utility.PDF | 4794 kB | 0 | IBM | DU01A 1410 7010 1302-1302 Surface Reinitialize and Flag Log Utility |
| pioneer_ts-wx65a_surface-mount_tune-up_woofer_system_trt11141_1996_sm.pdf | 11/03/21 | Pioneer Audio TS-WX65A pioneer_ts-wx65a_surface-mount_tune-up_woofer_system_trt11141_1996_sm.pdf | 1120 kB | 0 | Pioneer | ts-wx65a surface-mount tune-up woofer system trt11141 1996 sm |
| H20-0140-1_1130_Numerical_Surface_Techniques_and_Contour_Map_Plotting_Application.pdf | 27/08/21 | IBM 1130 program_libr H20-0140-1_1130_Numerical_Surface_Techniques_and_Contour_Map_Plotting_Application.pdf | 254 kB | 0 | IBM | H20-0140-1 1130 Numerical Surface Techniques and Contour Map Plotting Application |
| k2645.pdf | 04/10/09 | - High Speed Switching - Low On-Resistance - No Secondary Breakdown - Low Driving Power - High Voltage - VGS = ± 30V Guarantee - Repetitive Avalanche Rated | 312 kB | 467 | FUSI | 2SK2645-01MR |
| S60MT_chassis_(CX7226).rar | 11/05/08 | -is fly back transistor 2SD1886 equivalent to BU508AF ? -secondary voltage 150Vcc appear 6 to 10 seconds then fall down and the power supply swich off ( when traying psu with a 25 W /220Vac lamp load connected between E and C fly-back position transist | 938 kB | 2965 | SAMSUNG | CF-5933Z |