Text preview for : 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20].pdf part of Agilent 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20] Agilent 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20].pdf



Back to : 5991-2917EN AFM SPM Acces | Home

Keysight Technologies
AFM/SPM Accessories




For the following Keysight AFM/SPM Systems:

5100

5420

5500

5500 ILM

5600 LS

6000 ILM
02 | Keysight | AFM/SPM Accessories - Brochure



Keysight Technologies AFM/SPM INSTRUMENTS



5100 AFM/SPM (N9420S)
The Keysight Technologies, Inc. 5100 atomic force microscope is a system that
delivers atomic resolution and provides excellent imaging capabilities in an easy-to-
upgrade package. The 5100 offers many of the same features as Keysight's sophis-
ticated 5500 AFM/SPM at an entry-level price. Since user requirements often grow,
the 5100 is fully upgradeable to the 5500. The 5100 comes with a Keysight multipur-
pose scanner, giving you the ability to switch AFM/SPM imaging modes.

5420 AFM/SPM (N9498S)
Based on the popular Keysight 5400 AFM/SPM, the 5420 features a new ergo-
nomic design and improved electronics. In addition to its remarkable affordable
price, this scientiic-grade microscope offers users electrical single-pass micros-
copy (ESPM) mode, which enables high-resolution KFM/EFM and PFM, as well
as scanning microwave microscopy (SMM) mode, which allows highly sensitive
calibrated electrical and spatial characterization.


5500 AFM/SPM (N9410S)
The Keysight 5500 is a powerful multiple-user research system for AFM/SPM. In
addition to atomic-scale resolution, true modularity enables you to add capabili-
ty-enhancing options as the need arises. The system's intelligent design permits the
simple integration of numerous imaging modes and easy-to-use, application-spe-
ciic sample-handling plates. Our balanced-pendulum, top-down multipurpose
scanners come in a range of sizes, all offering outstanding linearity and accuracy.


5600 LS AFM/SPM (N9480S)
The Keysight 5600 LS allows high-resolution imaging of both large samples (in air)
and small samples (in air, or in liquid under temperature control) with a 9