Text preview for : 5990-9430EN Surviving State Disruptions Caused by Test_ A Case Study - Article Reprint c20140730 [16 part of
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Keysight Technologies
Surviving State Disruptions
Caused by Test: A Case Study
Kenneth P. Parker, Keysight Technologies
Shuichi Kameyama1, Fujitsu Limited
David Dubberke, Intel Corporation
1. Also with Ehime University, Matsuyama, Ehime, Japan.
Abstract The practice of initializing a board or system for testing purposes is not an exact
science, but rather, pursued empirically and with an increasing risk of undesired
side effects. It has been suspected that Boundary-Scan testing can cause such
side effects. This paper provides a case study of such a board where a detailed
root-cause analysis was performed. Some issues are identified that justify add-
ing features to IEEE 1149.1 that will facilitate safe, fast and effective initializa-
tion of a board or system, to get it ready for testing and to leave it in a safe state
upon completion of testing.
1 Disclaimer There is a Working Group for IEEE 1149.1 that is revising the standard and could
implement some of the ideas presented in this paper (see [IEEEWG]). The con-
tent of this paper may not reflect the group's final thinking and results. Opinions
stated throughout this paper are those of the authors.
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