Text preview for : X-Parameter Measurements 5990-4464EN c20140812 [2].pdf part of Agilent X-Parameter Measurements 5990-4464EN c20140812 [2] Agilent X-Parameter Measurements 5990-4464EN c20140812 [2].pdf
Back to : X-Parameter Measurements | Home
X-Parameter Measurements
Keysight Technologies and
Maury Microwave
Reduce design cycles by up to 50% with
X-parameter measurements
X-parameters* are being used increasingly in place of S-parameters in the design of