Text preview for : 5989-2785EN English _ 2013-10-29 _ PDF 348 KB c20131030 [24].pdf part of Agilent 5989-2785EN English 2013-10-29 PDF 348 KB c20131030 [24] Agilent 5989-2785EN English _ 2013-10-29 _ PDF 348 KB c20131030 [24].pdf



Back to : 5989-2785EN English _ 201 | Home

Agilent B1500A
Semiconductor Device Analyzer
Data Sheet




Introduction
The Agilent B1500A Semiconductor Device Analyzer is the only
parameter analyzer with the versatility to provide a wide range of
device characterization capabilities, uncompromised measurement
reliability, and eficient and repeatable measurement. It supports all
state-of-the-art measurements (IV, CV, and fast pulsed IV), giving
it the ability to cover the electrical characterization and evaluation
of devices, materials, semiconductors, active/passive components,
or virtually any other type of electronic device. In addition, the
B1500A's modular architecture with ten available slots allows you
to add or upgrade measurement modules if your measurement
needs change over time.

Agilent EasyEXPERT, resident GUI-based software running on the
B1500A's embedded Windows 7 platform, supports eficient and
repeatable device characterization ranging from interactive manual
measurements all the way up to test automation across a wafer
in conjunction with a semiautomatic wafer prober. With hundreds
of ready-to-use measurements (application tests) furnished at no
charge, EasyEXPERT makes it easy to perform complex device char-
acterization immediately. The EasyEXPERT GUI can be accessed
using the B1500A's 15-inch touch screen, as well as through an
optional USB keyboard and mouse. EasyEXPERT also allows you the
option of storing test condition and measurement data automati-
cally after each measurement in unique workspaces, ensuring that
valuable information is not lost and that measurements can be
repeated at a later date. Finally, EasyEXPERT has built-in analysis
capabilities and a graphical programming environment that facilitate
the development of complex testing algorithms.
Basic Features
Measurement capabilities:
Current versus voltage (IV) measurement Pulse Generation Speciication conditions