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Keysight Technologies
Paving the Way for
Research and Innovation
Table of Contents

Introduction................................................................................................ 3
Materials Measurement .......................................................................... 4
Device Characterization in Terahertz .................................................... 5
Millimeter-wave Measurements ............................................................ 6
RF and Communications .......................................................................... 8
Nanotechnology ...................................................................................... 11
Energy Research ..................................................................................... 13
Non-linear Waveform Measurements ................................................ 15
Modular Solutions .................................................................................. 16
Design and Simulation Software ......................................................... 17
Resources, Partnerships and Collaboration ....................................... 18

2
Introduction
Research often goes beyond scientific discovery to become the discovery of new
sciences. As you develop hypotheses, new theorems and theories to expand
the world's knowledge, confidence in measurements is paramount. In research
laboratories around the world, Keysight Technologies, Inc. instrumentation and
partnership has become an integral part of advanced experimental systems.

As the world's premier measurement company, Keysight works in close
collaboration with engineers, scientists, and researchers around the globe to meet
the communications, electronics, life sciences, material sciences and chemical
analysis challenges of today and tomorrow. Keysight is committed to providing
innovative measurement solutions that enable our electronics and bio-analytical
customers and partners deliver the products and services that make a measurable
difference in the lives of people everywhere.

This brochure highlights key research areas in which Keysight is involved such as;
materials measurement, device characterization, millimeter-wave, nanotechnology,
RF and communications and renewable energy, and the solutions that can help
you meet your research and development objectives. Keysight offers a full breath
of electronic equipment for both teaching and research labs and also provides
solutions for your specific research needs.
Materials Measurement

From meta-materials to dielectric substrates, microwave food products to
University of Washington's Applied
bio-fuels, accurate characterization of electromagnetic properties at RF,
Physics Laboratory and Center for Process
microwave and mm-wave frequencies provide scientists with critical information
Analytical Chemistry, are working on
needed for material and circuit design, modeling, research, manufacturing and
new sensors to monitor carbon nano-
quality control. Keysight offers a wide variety of instruments and fixtures to meet
tube sonication. Utilizing Keysight's
the most demanding needs.
PNA Series Network analyzer and the
85070E Dielectric Probe Kit for complex
permittivity measurements, researchers 4294A Precision Impedance Analyzer, 40 Hz to 110 MHz
have developed a principle component
This is an integrated solution for the measurement and analysis of components
analysis to categorize single and double
and circuits as well as dielectric, magnetic and semiconductor materials. Its
walled carbon nano-tubes in a solution.
equivalent circuit function automatically extracts a circuit model from measured
data, letting you analyze the characteristics
of your device or material. Additional test
fixtures allows for dielectric constant and
impedance measurements of liquids.

E4991A Impedance/Material Analyzer, 1MHz to 3GHz
This instrument offers ultimate impedance measurement performance and powerful
built in analysis function. The optional 16453A Dielectric Material Test Fixture
enables measurements of dielectric constant and loss tangent of solid materials,
while the 16454A Magnetic Material Test fixture offers accurate permeability
measurements of toroidal -- shaped magnetic materials.

ENA, PNA-L, PNA and PNA-X series Network Analyzers
From 5 Hz to 1.1 THz, choose from a growing selection of RF and Microwave
network analyzers with the appropriate accessories for your materials measurement
needs. Further analysis can be done by adding the 85070E Dielectric Probe Kit to
measure complex permittivity of liquids, conformable
solids, or smooth flat hard solids. High Temperature,
Slim Form and Performance Probes are available and
Waveguide, FreeSpace and NRL Arch methods are
supported. Add the 85071E Materials Measurement
Software with appropriate sample holders and test
fixtures to measure electromagnetic properties
of dielectric and magnetic materials over a broad
frequency range.

4
Device Characterization in TeraHertz

Interest in terahertz is accelerating since many materials exhibit unique
For many years, the University of Leeds
terahertz frequency-range properties that provide high contrast for imaging and
Photonics Laboratory has performed some
spectroscopic materials identification. There also is a need for measurement
of the world's best research in terahertz.
equipment to be expanded into the terahertz region not only to support these
In the past five years its program has
applications but also to measure devices that, due to Moore's law, are rapidly
expanded to include involvement with
pushing up toward 1 THz and beyond. From detecting cancer tumors to inspecting
most aspects of the terahertz research
semiconductors, terahertz measurements are gradually increasing.
going on around the world. As a leading
provider of microwave, millimeter wave
Directly Connected PNA-X Based Solutions and IR/optical measurement equipment,
Keysight Technologies is supporting
These solutions connect directly to the front panel of a dual source PNA-X Network some of this research with an eye toward
Analyzer and do not require a millimeter-wave test set controller. This configuration expanding our measurement coverage
with allows full S-Parameter measurements up to 1.1 THz, and is a fully integrated into this area -- and exploring new
solution that provides stable and repeatable measurements in the THz frequencies possibilities in measurement, imaging and
using a PNA-X. spectroscopy.
The Key features of this solution are: