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HEWLETT PACKARD
JOURNAL
TECHNICAL INFORMATION FROM THE -dp- LABORATORIES
No. 3-4
^^^^^H
BLISHED BY THE HEWLETT-PACKARD COMPANY, 275 PAGE MILL ROAD, PALO ALTO, CALIFORNIA NOV.-DEC, 1957
An Improved Method For Measuring
Losses In Short Waveguide Lengths
ONE OF the difficult and recurring meas and other types of guide, and is accurate within
urements in microwave work is meas approximately 10%. In addition, determina
uring the losses in short lengths of waveguide tion can be made as to whether losses are dis