Text preview for : 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper part of Agilent 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper Agilent 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Experiments c20141020 [8].pdf



Back to : 5991-2907EN Electromagnet | Home

Keysight Technologies
Electromagnetic Simulations at the
Nanoscale: EMPro Modeling and Comparison
to SMM Experiments

Application Note




Introduction
n this application note, we describe electromagnetic (EM) simulations using Keysight
Technologies' EMPro software1 to support the interpretation of scanning microwave
microscope (SMM) experiments. The SMM is a new scanning probe microscope that
combines the electromagnetic measurement capabilities of a microwave Performance
Network Analyzer (PNA) with the nanometer-resolution and Angstrom-scale positioning
capabilities of an atomic force microscope (AFM).

Scanning microwave microscopy is a technique for measuring reflection scattering
parameters and corresponding electric properties of materials at the nanoscale in the
frequency range of 1