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Keysight Technologies
Pulsed-IV Parametric Test Solutions
Selection Guide
Introduction
Pulsed-IV parametric testing is becoming an increasingly common requirement for the development
of semiconductor process and the evaluation of semiconductor devices. In recent years, the need for
very accurate pulsed IV measurement has increased due to the development of more advanced pro-
cesses utilizing exotic materials, the push for devices with lower power consumption, and many other
factors.
To meet these needs Keysight Technologies, Inc. offers a variety of pulsed-IV parametric test solutions
that supply the widest range of pulse widths, voltage/current output, and performance available in the
industry. Each solution is well-proven and has already been used by many researchers worldwide to
meet various advanced measurement needs. These range from the process development of cutting-
edge technologies utilizing high-k gate dielectrics and SOI transistors to the evaluation of more
conventional semiconductor process such as GaAs and HEMT or new materials such as SiC, GaN or
Organic devices which require both high voltage and high current measurement capabilities.
This selection guide provides an overview and side-by-side comparison of all of Keysight's pulsed-IV
parametric test solutions to enable you to determine the best solution to meet your unique needs.
Table 1. Multiple options for advanced pulsed measurement needs
Selecting the Best Solution to Meet Your Measurement Needs
This selection guide is designed to 5. Software is also key factor to need to put sufficient forethought
assist you in comparing Keysight's control measurement equipment into the creation of the test struc-
pulsed-IV measurement solutions or to synchronize two or more tures that will be used to make the
and selecting the best one for your equipment on the Pulsed IV measurement. Attempts to make fast
measurement applications. By measurement. In some cases, the pulsed measurements with conven-
following the steps outlined below calculation is required to evaluate tional DC test structures using DC
you should be able to determine the current from voltage. Keysight sup- positioners are in general unlikely to
proper measurement solution to meet plies a library of application tests yield good measurement results. In
your needs. for performing pulsed IV measure- general, fast pulsed measurements
ment on the EasyEXPERT software. require test structures designed
1. For each of the pulsed-IV specifica- for a ground-signal (GS) or ground-
tions listed below, determine your 6. To succeed in making high speed signal-ground (GSG) measurement
measurement requirements. pulsed IV measurement you need environment and RF positioners. The
more than just the correct mea- following figure illustrates this point.
Note: Make sure that you under- surement instrumentation; you also
stand that some solutions only
work for specific device types and
configurations. Drain pulse
width