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Printed in USA March 2000
User's Guide
HP 8510 Pulsed-RF Network Analyzer
ABCDE
HP Part No. 08510{90505
Printed in USA March 1995
Notice
The information contained in this document is subject to change without notice.
Hewlett-Packard makes no warranty of any kind with regard to this material, including,
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Copyright 1988 Hewlett-Packard Company.
c All Rights Reserved. Reproduction,
adaptation, or translation without prior written permission is prohibited, except as allowed
under the copyright laws.
Santa Rosa Systems Division, 1400 Fountaingrove Pkwy, Santa Rosa, CA 95403-1799
CERTIFICATION
Hewlett-Packard Company certi es that this product met its published speci cations at the
time of shipment from the factory. Hewlett-Packard further certi es that its calibration
measurements are traceable to the United States National Institue of Standards and Technology
(NIST, formerly NBS), to the extent allowed by the institute's calibration facility, and to the
calibration facilities of other International Standards Organization members.
WARRANTY
This Hewlett-Packard instrument product is warranted against defects in material and
workmanship for a period of one year from date of delivery. During the warranty period,
Hewlett-Packard Company will, at its option, either repair or replace products which prove to
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For warranty service or repair, this product must be returned to a service facility designated
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return the product to Buyer. However, Buyer shall pay all shipping charges, duties, and taxes
for products returned to HP from another country.
HP warrants that its software and rmware designated by HP for use with an instrument
will execute its programming instructions when properly installed on that instrument. HP
does not warrant that the operation of the instrument, or software, or rmware will be
uninterrupted or error free.
LIMITATIONS OF WARRANTY
The foregoing warranty shall not apply to defects resulting from improper maintenance by
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iii
Contents
1. Introduction
Organization of This Document . . . . . . . . . . . . . . . . . . . . . 1-1
System Description . . . . . . . . . . . . . . . . . . . . . . . . . 1-1
Principles of Pulsed-RF Network Measurements . . . . . . . . . . . . . 1-1
Pulse Measurements Overview . . . . . . . . . . . . . . . . . . . . 1-1
Operating the HP 8510 for Pulsed-RF Measurements . . . . . . . . . . 1-1
Frequency Domain Point-in-Pulse Measurements . . . . . . . . . . . . 1-2
Pulse Pro le Domain Measurements . . . . . . . . . . . . . . . . . . 1-2
General Timing Information . . . . . . . . . . . . . . . . . . . . . 1-2
Using External Triggering and Pulse Modulation . . . . . . . . . . . . 1-2
High Power Measurements . . . . . . . . . . . . . . . . . . . . . . 1-2
Reference Data . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-2
2. System Description
Who Should Make Pulsed-RF Measurements? . . . . . . . . . . . . . . 2-1
Theory of Operation . . . . . . . . . . . . . . . . . . . . . . . . 2-2
Test Set Signal Flow . . . . . . . . . . . . . . . . . . . . . . . . 2-3
3. Principles of Pulsed-RF Network Measurements
Pulse Repetition Period, PRP . . . . . . . . . . . . . . . . . . . . . 3-1
Pulse Repetition Frequency, PRF . . . . . . . . . . . . . . . . . . . . 3-1
Duty Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2
Pulse Width . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2
Rise/Fall Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2
Trigger Delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2
Pulse Pro le Measurement Resolution Period . . . . . . . . . . . . . . . 3-3
4. Pulse Measurements Overview
Pulsed-RF S-parameters versus Frequency . . . . . . . . . . . . . . . . 4-1
Pulse Pro le Domain . . . . . . . . . . . . . . . . . . . . . . . . . 4-3
5. Operating the HP 8510 for Pulsed-RF Measurements
System Connections . . . . . . . . . . . . . . . . . . . . . . . . . . 5-1
Turn On System Power . . . . . . . . . . . . . . . . . . . . . . . . 5-3
Load Pulse Hardware State and Instrument State Files . . . . . . . . . 5-3
Operator's Check . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-5
Pulse Pro le Domain Check . . . . . . . . . . . . . . . . . . . . . 5-5
Frequency Domain Check . . . . . . . . . . . . . . . . . . . . . . 5-7
External Triggering Check . . . . . . . . . . . . . . . . . . . . . . 5-9
Contents-1
6. Frequency Domain Point-in-Pulse Measurements
Measurement Calibration for Point-in-Pulse . . . . . . . . . . . . . . . 6-1
Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-1
Set Pulse Polarity . . . . . . . . . . . . . . . . . . . . . . . . . . 6-1
Set Pulse Width . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Set Duty Cycle Limit . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Set Trigger Delay . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2
Connect the Device Under Test . . . . . . . . . . . . . . . . . . . . 6-2
7. Pulse Pro le Domain Measurements
Measurement Calibration for Pulse Pro le . . . . . . . . . . . . . . . . 7-1
Pulse Pro le Domain . . . . . . . . . . . . . . . . . . . . . . . . 7-1
Frequency Domain Using Frequency List . . . . . . . . . . . . . . . . 7-2
Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-4
Set Pulse Polarity . . . . . . . . . . . . . . . . . . . . . . . . . . 7-4
Set Pulse Width . . . . . . . . . . . . . . . . . . . . . . . . . . 7-5
Set Duty Cycle Limit . . . . . . . . . . . . . . . . . . . . . . . . 7-5
Set Measurement Time Span . . . . . . . . . . . . . . . . . . . . . 7-5
Set Measurement Resolution Period . . . . . . . . . . . . . . . . . . 7-5
Connect the Device under Test . . . . . . . . . . . . . . . . . . . . 7-5
Switching Between Frequency Domain and Pulse Pro le Domain . . . . . . 7-7
8. General Timing Information
Network Analyzer Measurement Cycle . . . . . . . . . . . . . . . . . . 8-1
Measurement Cycle Time . . . . . . . . . . . . . . . . . . . . . . 8-3
Sweep Time . . . . . . . . . . . . . . . . . . . . . . . . . . 8-3
Pulse Width . . . . . . . . . . . . . . . . . . . . . . . . . . 8-3
Duty Cycle Limit . . . . . . . . . . . . . . . . . . . . . . . . 8-3
Pulse Pro le Domain Stop Time . . . . . . . . . . . . . . . . . 8-3
Frequency Domain Trigger Delay . . . . . . . . . . . . . . . . . 8-3
Pulse Repetition Period and Duty Cycle Considerations . . . . . . . . . . 8-4
External Trigger and Stop Sweep Signals . . . . . . . . . . . . . . . . . 8-5
9. Using External Triggering and Pulse Modulation
Connect the Pulse Generator . . . . . . . . . . . . . . . . . . . . . . 9-1
10. High Power Measurements
Signal Level Characteristics . . . . . . . . . . . . . . . . . . . . . . 10-1
Connecting external signal conditioning . . . . . . . . . . . . . . . . . 10-2
Example High Power Measurements . . . . . . . . . . . . . . . . . . . 10-3
Measure a 30 dB Ampli er . . . . . . . . . . . . . . . . . . . . . . 10-3
Measure an Ampli er with High Input Levels . . . . . . . . . . . . . . 10-4
Using the Port 1 and Port 2 Attenuators . . . . . . . . . . . . . . . . . 10-5
Controlling the Attenuators . . . . . . . . . . . . . . . . . . . . . 10-5
Measure User Parameters and Set Attenuators . . . . . . . . . . . . . 10-5
Changing Signal Path After Calibration . . . . . . . . . . . . . . . . . 10-6
Set the Attenuators . . . . . . . . . . . . . . . . . . . . . . . . . 10-6
Store Trace Memories . . . . . . . . . . . . . . . . . . . . . . . . 10-6
View the Normalized Parameters . . . . . . . . . . . . . . . . . . . 10-7
Selecting the Appropriate Measurement Calibration . . . . . . . . . . . . 10-7
General Calibration and Measurement Sequence . . . . . . . . . . . . . 10-9
Contents-2
General Calibration and Measurement Sequence Using Display Math . . . . 10-9
11. Reference Data
Creating Pulse Hardware State and Instrument State Files . . . . . . . . . 11-1
Pulse Menus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-2
Pulse Con guration Menu . . . . . . . . . . . . . . . . . . . . . . 11-2
DETECTOR: WIDE BW . . . . . . . . . . . . . . . . . . . . . 11-2
DETECTOR: NORMAL BW . . . . . . . . . . . . . . . . . . . 11-3
PULSE WIDTH . . . . . . . . . . . . . . . . . . . . . . . . . 11-3
DUTY CYCLE . . . . . . . . . . . . . . . . . . . . . . . . . . 11-3
PULSE OUT: HIGH . . . . . . . . . . . . . . . . . . . . . . . 11-3
PULSE OUT: LOW . . . . . . . . . . . . . . . . . . . . . . . . 11-3
TRIGGER DELAY . . . . . . . . . . . . . . . . . . . . . . . . 11-3
TRIG MODE: INTERNAL . . . . . . . . . . . . . . . . . . . . 11-3
TRIG MODE: EXTERNAL . . . . . . . . . . . . . . . . . . . . 11-3
HP 8510 Option 008 Added Programming Codes . . . . . . . . . . . . . 11-4
HP 8510 Option 008 Added Query Commands . . . . . . . . . . . . . . 11-4
Contents-3
Figures
1-1. HP 8510 Pulsed-RF Network Analyzer System . . . . . . . . . . . . . 1-3
2-1. Simpli ed Pulsed-RF Network Analyzer Block Diagram . . . . . . . . . 2-2
2-2. HP 85110A S-Parameter Test Set Signal Flow . . . . . . . . . . . . . 2-4
3-1. Pulse Terms and De nitions . . . . . . . . . . . . . . . . . . . . . 3-3
4-1. Pulsed-RF S-Parameters versus Frequency (Frequency Domain Point-in-Pulse) 4-2
4-2. Pulsed-RF S-Parameters versus Time (Pulse Pro le Domain) Measurement
Internal Pulse Output and Internal Measurement Trigger . . . . . . . 4-4
5-1. System Cable Connections . . . . . . . . . . . . . . . . . . . . . . 5-2
5-2. Typical Response After Recall, Inst. State 8, Frequency, Detector: WB, Mult.
Srce. On . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-4
5-3. Domain, Pulse Pro le, Marker . . . . . . . . . . . . . . . . . . . . 5-4
5-4. Pulse Pro le, User1 a1, Marker . . . . . . . . . . . . . . . . . . . 5-6
5-5. Pulse Pro le, S11 . . . . . . . . . . . . . . . . . . . . . . . . . . 5-6
5-6. S11 , Frequency Domain, Pulse Width 10 s,Trigger Delay 5 s . . . . . . 5-7
5-7. S11 , Frequency Domain, Pulse Width 10 s,Trigger Delay 15 s . . . . . . 5-8
6-1. Ampli er Gain, Frequency Domain Point-in-Pulse . . . . . . . . . . . . 6-3
7-1. Frequency List Display During Measurement Calibration . . . . . . . . . 7-3
7-2. Pulse Pro le, Frequency List Segment Number 1 . . . . . . . . . . . . 7-3
7-3. S21 , Pulse Pro le, Thru . . . . . . . . . . . . . . . . . . . . . . . 7-4
7-4. Minimum Time Span, Resolution Period = 100 ns . . . . . . . . . . . . 7-6
7-5. S11 , Smith Chart . . . . . . . . . . . . . . . . . . . . . . . . . . 7-6
8-1. Network Analyzer Measurement Cycle . . . . . . . . . . . . . . . . . 8-2
8-2. Example Internal Pulse Output PRP and Duty Cycle . . . . . . . . . . 8-4
8-3. External Trigger and Stop Sweep Timing Diagram . . . . . . . . . . . 8-5
9-1. External Control of PRP and Duty Cycle . . . . . . . . . . . . . . . 9-2
9-2. Using External Trigger and External Modulation PRP = 10 microseconds,
Duty Cycle = 50% . . . . . . . . . . . . . . . . . . . . . . . . 9-3
10-1. Test Set Maximum Signal Levels . . . . . . . . . . . . . . . . . . . 10-2
10-2. Measuring a 30 dB gain Ampli er . . . . . . . . . . . . . . . . . . . 10-3
10-3. Measuring an Ampli er with High Input Levels . . . . . . . . . . . . . 10-4
11-1. Option 008 Domain, Stimulus, and System Menus . . . . . . . . . . . . 11-5
Contents-4
1
Introduction
This document is intended for use with the HP 8510B/C Option 008 Network Analyzer
and is a supplement to the HP 8510B/C Operating and Programming manual. It contains
descriptions of the pulsed-RF network analyzer system features for measurements in the
frequency domain and in the pulse pro le domain. With respect to the standard, swept CW
system, operation of the pulsed-RF system is identical except that the measurement is made
at a speci c, known time during each pulse. For information about network analysis, please
refer to HP Product Note 8510-10, HP 8510B Introductory User's Guide, for an introduction
to using the front panel for measurement setup, measurement calibration, and basic network
measurements.
Organization of This Document
This section contains a list of the chapters in this document and a brief description of the
contents of each chapter.
System Description
Introduces the HP 8510B/C Option 008 Pulsed-RF measurement capability.
Principles of Pulsed-RF Network Measurements
A list of the terms and de nitions used in pulsed-RF network measurements.
Pulse Measurements Overview
A description of how the network analyzer measures pulsed-RF S-parameters versus frequency
and versus time.
Operating the HP 8510 for Pulsed-RF Measurements
Describes the setup, measurement calibration, and measurement process for setting up the
system and making pulsed-RF measurements.
Introduction 1-1
Frequency Domain Point-in-Pulse Measurements
This chapter contains measurement calibration and measurement procedures to display the
pulsed-RF S-parameters versus frequency.
Pulse Profile Domain Measurements
This chapter contains measurement calibration and measurement procedures to display the
pulsed-RF S-parameters versus time.
General Timing Information
Descriptions of the internal timing to show the system's internal pulse repetition period and
duty cycle capabilities.
Using External Triggering and Pulse Modulation
This section contains information to help you determine if your application requires external
pulse modulating equipment, and instructions for connecting the external equipment.
High Power Measurements
Discusses the special considerations required to protect the test system and maintain accuracy
when making measurements at high RF power levels.
Reference Data
Shows all option 008 menu structures and key de nitions, including programming codes.
1-2 Introduction
Figure 1-1. HP 8510 Pulsed-RF Network Analyzer System
Introduction 1-3
2
System Description
This chapter contains the following information.
A description of the HP 8510 Pulsed-RF Network Analyzer System.
A simpli ed block diagram of the HP 8510 Pulsed-RF Network Analyzer System.
A signal ow diagram of the HP 85110-series S-parameter Test Set.
Who Should Make Pulsed-RF Measurements?
Pulsed-RF stimulus may be required in cases where continuous application of the test signal
could destroy the device, such as when testing occurs prior to packaging, or where the device
must be tested using a PRF and duty cycle that accurately represents its nal application.
The HP 8510 pulsed-RF network analyzer con guration adds specialized hardware and an
optimized rmware feature set to make fully error-corrected S-parameter measurements of
pulsed-RF responses. For the rst time, the combination of wideband IF and accurate timing
circuits provides precise synchronization with the pulse, allowing S-parameters to be measured
at a precisely known, repeatable time during the pulse. This extends the HP 8510 applications
into two major areas: tests in which the stimulus signal to the device is pulsed, and tests of
devices which accept a CW input and produce a pulsed output.
The HP 8510 pulsed-RF network analyzer system allows you to calibrate in the same
environment as your measurement. For example, if you are making a high power, pulsed-RF
measurement, you can calibrate in the same high power, pulsed-RF mode. Calibration data is
taken only while the pulse is on. This type of calibration may prevent damage to calibration
standards that would be damaged in high power, CW calibrations.
The recommended con guration of the HP 85108 Pulsed-RF Network Analyzer consists of the
following items.
HP 8510B/C network analyzer equipped with Option 008, Wideband IF, and HP 8510
rmware revision B.05.11 or greater (for the HP 8510B), or revision C.06.54 or greater (for
HP 8510C).
HP 83622 synthesized sweeper with options 001, 003, 004, and 008.
HP 83624 synthesized sweeper with options 003, 004, and 008.
HP 85110-series pulsed-RF fundamentally mixed S-parameter test set
Also, other external equipment such as power ampli ers, bias supplies and pulse generators
may be included in the system.
System Description 2-1
The pulsed-RF network analyzer system allows you to select either the normal precision 10
kHz IF bandwidth or the new wideband 3 MHz IF bandwidth. The wide IF and detection
bandwidth allows testing using pulses as short as 1 microsecond but with accuracy comparable
to traditional non-pulsed measurements.
These system components may be rack-mounted or arranged on a desktop.
Theory of Operation
A simpli ed block diagram of the system is shown in Figure 2-1. One synthesizer provides
the test signal stimulus to the RF input of the test set and the other provides the LO signal
to the four frequency converters (only two are shown). The LO source is always tuned 20
MHz above the test signal source. The standard internal phaselock technique is not used;
instead, a common 10 MHz frequency reference is used for both of these sources and the
internal sample selection and timing logic in the HP 8510. These sources are considered to be
coherent, thus generating the correct 20 MHz rst IF and the correct clock frequency for the
reference and test synchronous detectors. This eliminates the need to use the reference signal
for receiver phaselock and allows all reference and test signals to be pulsed, thereby making
fully error-corrected 2-port, pulsed-RF S-parameter measurements possible.
Figure 2-1. Simplified Pulsed-RF Network Analyzer Block Diagram
Using a wider bandwidth in both the reference and the test IF, synchronous detectors that
operate at 20 MHz, and accurate measurement sample timing circuits allow exible analysis
of device response during the pulse. With the sources and test set controlled by the HP 8510
over the 8510 system bus, and with all necessary pulse generation and measurement timing
signals generated internally from a common 10 MHz reference, the HP 85108 is a complete
pulsed-RF stimulus/response test system. One pulse of a user-speci ed width is measured at
each data point and the measurement is synchronized so that it is made at a certain known
time in the pulse. The stimulus duty cycle can be predicted for a given instrument state,
but the actual pulse repetition period depends upon the current domain, cal type, averaging,
sweep time, and pulse width selections. For this reason, if your device is sensitive to duty
cycle, refer to General Timing Information.
2-2 System Description
Either the internal logic, the TTL Trigger Input, or the HP-IB Group Execute Trigger from
an external controller can initiate a measurement cycle. When control of the pulse repetition
period and duty cycle is required, the HP 8510 can use the trigger input to synchronize with
the internal or an external pulse modulator. The HP 8510 Stop Sweep output can be used as
a gating signal to tell when the analyzer is ready for the next measurement. The measurement
is made with 100 nanosecond resolution and about 200 picosecond uncertainty with respect to
the internally- or externally-generated measurement trigger.
Test Set Signal Flow
Figure 2-2 shows a detailed diagram of the HP 85110-series test set signal separation, signal
routing, and frequency conversion. This is a fundamentally mixed test set, providing four 20
MHz outputs to the network analyzer. Placement of a 0 to 90 db (10 dB/step) attenuator
before each mixer provides control of the signal levels into the mixers while allowing operation
at high PORT 1 and PORT 2 signal levels necessary in many pulsed-RF applications.
The test set has rear panel access links to allow integration of additional test and signal
conditioning equipment in the low-loss main signal paths to the test ports. If your device
exhibits more than about 20 dB of gain, or higher port signal levels are required, refer to the
High Power Measurements chapter.
Hewlett-Packard harmonic mixing test sets are designed to work with the normal 10 kHz IF
and detectors. These include the HP 8514, 8515, and 8516 coaxial test sets; and the HP 85104
millimeter waveguide test set. This HP 85110 fundamental mixing test set is designed to work
with the wideband IF and detectors. There are applications in which the HP 85110 can be
used with normal IF and detectors. The HP 85104 millimeter test sets can be con gured to
operate with the wideband IF and perform the pulse measurement functions described here.
All HP coaxial test sets can be equipped to include Option 001, IF Switching for Multiple
Test Sets, so a system can be equipped for a wide range of applications by including up to
four coaxial test sets and a millimeter-wave test set.
System Description 2-3
Figure 2-2. HP 85110A S-Parameter Test Set Signal Flow
2-4 System Description
3
Principles of Pulsed-RF Network Measurements
This chapter contains a list of terms used to describe the pulsed-RF stimulus and response.
Figure 3-1 shows a typical envelope of the pulsed-RF waveform output by the RF signal
source. For internal measurement triggering, the RF frequency and the ON time of the pulse
is controlled by the HP 8510 so that there is one pulse per measurement.
Pulse Repetition Period, PRP
The time from the 50 percent point on the rising edge of one pulse to the 50 percent point on
the rising edge of the next pulse.
For internal triggering operation the system PRP depends upon the instrument state.
Typically there is one pulse per measurement. The pulse is turned ON for a user-speci ed
time and the measurement is made at some user-speci ed time relative to the start of the
pulse. The time until the next pulse consists rst of the time required for the analyzer to set
up for the next measurement and second, if necessary, waiting to satisfy the user-speci ed
pulse width and duty cycle limit.
In the frequency domain, when the analyzer is tuned to the next frequency, the maximum
PRP is about 30 milliseconds. In the Pulse Pro le domain, the frequency does not change,
making the maximum PRP about 3 milliseconds. With averaging, the PRP can be about 1
millisecond during part of the measurement. Other factors which aect the system PRP are
calibration type, pulse width, duty cycle, and pulse pro le domain stop time.
If the PRP is controlled externally, the HP 8510 external trigger input is used to synchronize
the analyzer with the pulse.
Pulse Repetition Frequency, PRF
1
P RF =
P RP
Principles of Pulsed-RF Network Measurements 3-1
Duty Cycle
The ratio of the time that the pulse is ON to the total Pulse Repetition Period. If the pulse
ON and OFF times are equal, the Duty Cycle is 50 percent.
For internal operation, the maximum duty cycle percent limit can be speci ed, but the actual
duty cycle may be less, depending upon the user-specifed pulse width and the time it takes for
the analyzer to set up for the next measurement.
Pulse Width
The ON time from the 50 percent point on the rising edge to the 50 percent point on the
falling edge.
The internally-generated Pulse Width can be set from less than 100 nanoseconds to 40.88
milliseconds.
Rise/Fall Time
The pulse transition time:
tr = pulse rise time
The time it takes for the pulse to rise from the 10 percent ON condition to the 90 percent ON
condition.
tf = pulse fall time
The time it takes for the pulse to fall from the 90 percent ON condition to the 10 percent ON
condition.
The normal IF responds to rise/fall times of about 75 microseconds; the wideband IF responds
to rise/fall times of about 300 nanoseconds.
Trigger Delay
The time after pulse ON that the measurement is actually made.
In the Frequency domain, the Trigger Delay can be set from down to -6 resolution periods
(internal) or +3 resolution periods (external) and up to 40.88 milliseconds. In the Pulse
Pro le domain the trigger delay is automatic depending upon the display time span, pulse
width, and number of points.
3-2 Principles of Pulsed-RF Network Measurements
Pulse Profile Measurement Resolution Period
The time between adjacent Pulse Pro le domain data points. The minimum is 100
nanoseconds. This is set by an algorithm depending upon the Pulse Pro le stop time, pulse
width, and number of time points.
Figure 3-1. Pulse Terms and Definitions
Principles of Pulsed-RF Network Measurements 3-3
4
Pulse Measurements Overview
This chapter contains information about how the HP 8510 pulsed-RF network analyzer system
measures pulsed-RF S-parameters versus frequency and versus time.
The pulsed-RF con guration allows use of vector network analysis techniques for two types of
measurements:
Pulsed-RF S-Parameters versus Frequency. The measurement is synchronized with the
pulse so that the measurement result is the S-parameter at a speci c user-speci ed point in
the pulse at each frequency of the sweep
Pulse Pro le. The system is tuned to a single frequency and the measurement is
synchronized with the pulse so that the measurement result is the S-parameter as a function
of time during the pulse.
Pulsed-RF S-parameters versus Frequency
Pulsed-RF tests in the frequency domain are accomplished by synchronizing the measurement
process with the pulse so that the measurement is made at a single, user-speci ed time
during the pulse. At each frequency, the sources are tuned, the RF is turned on, then the
measurement is made after a certain delay. Figure 4-1 shows an example of this \frequency
domain point-in-pulse" measurement using the internal pulse output and the internal
measurement trigger. For internal trigger mode, each data point of the trace represents the
response of the device to the pulsed stimulus at the same interval after the pulse is turned on.
For external trigger mode, each data point of the trace represents the response of the device to
the pulsed stimulus after the falling edge of the externally-generated measurement trigger.
Pulse Measurements Overview 4-1
Figure 4-1. Pulsed-RF S-Parameters versus Frequency (Frequency Domain Point-in-Pulse)
4-2 Pulse Measurements Overview
Pulse Profile Domain
Measurements in the Pulse Pro le domain create a plot of the response as a function of
time in synchronization with the internal or the external measurement trigger. A repetitive
sampling technique is used, in which the data is reconstructed from samples taken from a
series of pulses. This allows display of the S-parameters versus time during the pulse. Figure
6 is an example of this process showing a timing diagram using the internal pulse modulation
and internal measurement trigger. For each pulse, a single point in the pulse is measured. A
pro le of the pulse is made by measuring the rst pulse at the user-speci ed Start time, then
increasing the measurement trigger delay by a certain time increment for each pulse until the
speci ed number of points is measured.
Time zero is the leading edge of the internally-generated pulse output waveform, or the falling
edge of the externally-generated measurement trigger waveform. The HP 8510 automatically
controls the time increment between samples, called the measurement resolution period,
using an algorithm that depends upon the greater of the user-speci ed pulse width or stop
time. This automatic selection of the time resolution can be seen by changing the number
of points and the time span. For narrow pulses and small time spans, the measurement
resolution period can be as small as 100 nanoseconds; for wide pulses and large time spans,
it can increase to multiples of 10 microseconds. With the internal measurement trigger,
the rst sample can be taken up to 6 resolution periods prior to time zero. When using
external triggering, the external trigger sets time zero and the rst sample can be taken three
resolution periods after time zero.
Pulse Measurements Overview 4-3
Figure 4-2.
Pulsed-RF S-Parameters versus Time (Pulse Profile Domain) Measurement
Internal Pulse Output and Internal Measurement Trigger
4-4 Pulse Measurements Overview
5
Operating the HP 8510 for Pulsed-RF Measurements
This chapter describes the setup, measurement calibration, and measurement process for
con guring the system and making frequency domain point-in-pulse measurements and
pulse pro le domain measurements. These procedures use the internal pulse modulation and
internal measurement trigger capabilities of the HP 8510 Option 008. Familiarize yourself
with these capabilities before setting up measurements that use external triggering techniques.
For more detailed information on the standard features of the HP 8510, refer to the HP 8510
Operating and Programming manual.
System Connections
Figure 5-1 shows the cable connections for the recommended HP 85108 pulse con guration.
Notice that the RF source serves as the 10 MHz frequency reference for the system, although
the reference can be the LO source or the HP 8510. Many applications will also include bias
supplies, ampli ers connected to the test set rear panel links, external pulse generators and
modulators, and a computer. Verify these basic connections and familiarize yourself with
other equipment that may be connected to the system.
Operating the HP 8510 for Pulsed-RF Measurements 5-1
Figure 5-1. System Cable Connections
5-2 Operating the HP 8510 for Pulsed-RF Measurements
Turn On System Power
Turn on rack power, line power to the sources, test set, and other equipment, and then the HP
8510. Depending upon the contents of HP 8510 Instrument State 8 and the current HP 8510
Hardware State, the system may not be fully operational immediately after initial power up.
Messages to the operator may appear on the screen and beep sounds may be heard. If so, load
the pulse instrument state and hardware state as described below. The rmware revision will
be displayed on the screen. It should be B.05.11 or later for HP 8510B, and C.06.54 or later
for HP 8510C.
Load Pulse Hardware State and Instrument State Files
The pulsed-RF con guration les are supplied with the option 008 equipment. Use the
following procedure to load the hardware state le 8 and the instrument state all le 8 into
HP 8510 memory.
1. Load the con guration tape/disk.
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Press 4TAPE/DISC5 STORAGE IS TAPE/DISC .
2. Load pulse hardware state.
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Press LOAD MORE HARDWARE STATE FILE 8 .
The M enhancement annotation should appear at the left side of the screen. This shows
that the HP 8510 is operating in the multiple source mode.
3. Load pulsed-RF instrument state into inst. state 8.
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Press LOAD INST. STATE 8 FILE 8 .
4. After loading the les, press RECALL INST. STATE 8 .
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Recalling instrument state 8 sets the correct instrument state for pulse operation.
If the wideband IF is selected, a W annotation will appear at the left side of the screen.
This shows that the wideband IF and detectors are selected and that the TTL signal at the
HP 8510 rear panel PULSE OUTPUT connector is activated. Select the wideband IF by
pressing the following keys.
5. Press 4SYSTEM5, MORE PULSE CONFIG DETECTOR: WIDE BW .
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NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Note Preset always selects DETECTOR: NORMAL BW .
If these les are not available, create the correct hardware state le and instrument state le
as described in the Creating Pulse Hardware and Instrument States chapter.
Operating the HP 8510 for Pulsed-RF Measurements 5-3
Figure 5-2.
Typical Response After Recall, Inst. State 8, Frequency, Detector: WB, Mult. Srce. On
Figure 5-3. Domain, Pulse Profile, Marker
5-4 Operating the HP 8510 for Pulsed-RF Measurements
Operator's Check
After loading the pulse instrument state and hardware state les, then recalling instrument
state 8, check operation of the pulsed-RF network analyzer (using internal triggering) by
performing the following basic tests. Refer to the menu diagrams on the last pages of this
document.
Pulse Profile Domain Check
1. Connect a short circuit to port 1 of the test set.
2. Press 4PARAMETER5 MENU USER a1 . You are viewing the unratioed value of the a1
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reference signal.
3. Press 4DOMAIN5 PULSE PROFILE . The signal level is high when the pulse is On and low
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when the pulse is O.
4. Press 4MARKER5 then move the marker to various points on the trace.
5. Press 4SYSTEM5 MORE PULSE CONFIG PULSE WIDTH .
NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
6. Change the pulse width value. Notice that as you increase the pulse width past a certain
point, the measurement time for each data point will increase.
7. Press DUTY CYCLE , then change the the duty cycle limit. This sets the maximum duty
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
cycle percent allowed by the internal measurement timing logic. Notice that combinations
of long pulse width and low percent duty cycle will increase the measurement time for
each data point.
8. Press 4STOP5, then change the Stop time. Adjust the pulse width, number of points, and
the stop time to achieve the desired display.
9. Press 4SYSTEM5 MORE PULSE CONFIG PULSE OUT: LOW . Notice that the polarity of the
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pulse changes.
10. Press PULSE OUT: HIGH .
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Operating the HP 8510 for Pulsed-RF Measurements 5-5
Figure 5-4. Pulse Profile, User1 a1, Marker
1. Press S11 to view the ratioed measurement. Notice that the trace is at when the pulse is
On and noisy when the pulse is O.
Figure 5-5. Pulse Profile, S11
5-6 Operating the HP 8510 for Pulsed-RF Measurements
This occurs because when the pulse is O, the network analyzer is measuring the ratio of
noise to noise, and since the noise is approximately equal in the reference and test signal
paths, the result is near 0 dB with respect to the On period of the pulse. Also, in this
measurement, some large spikes may be seen in the noisy part of the trace. If the noise in the
reference channel instantaneously goes to a very small value, the ratio will increase to a very
large value.
Note In the Pulse Pro le domain:
Without averaging, pulse width and duty cycle settings resulting in less than
about 3 milliseconds PRP will not change the actual system PRP.
With averaging, pulse width and duty cycle settings resulting in less than
about 1 millisecond PRP will not change the actual system PRP.
Also, the PRP and duty cycle can vary during the sweep. To learn more about
control of these values, refer to the General Timing Information chapter.
Frequency Domain Check
1. Press 4DOMAIN5 FREQUENCY .
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2. If the W annotation does not appear, press 4SYSTEM5 MORE PULSE CONFIG
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DETECTOR: WIDE BW .
3. Press 4MARKER5, then move the marker to various points on the trace.
4. Press PULSE WIDTH and set the pulse width to 10 microseconds.
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Figure 5-6. S11, Frequency Domain, Pulse Width 10 s,Trigger Delay 5 s
Operating the HP 8510 for Pulsed-RF Measurements 5-7
1. Press 4STIMULUS MENU5 MORE TRIGGER MODE TRIGGER DELAY .
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Change the trigger delay and notice that when the trigger delay is greater than the pulse
width, the trace level decreases to the noise oor because the measurement is being made
after the pulse has turned O.
Figure 5-7. S11, Frequency Domain, Pulse Width 10 s,Trigger Delay 15 s
1. Press 4SYSTEM5 MORE PULSE CONFIG PULSE WIDTH . Change the pulse width value. Notice
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that as you increase the pulse width past a certain point, the measurement time for each
data point will increase.
2. Press DUTY CYCLE . Change the the duty cycle limit. This changes the maximum duty
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cycle percent allowed by the internal measurement timing logic. Notice that combinations
of long pulse width and low percent duty cycle will increase the measurement time for each
data point.
Note Frequency Domain System Duty Cycle
In the Frequency domain:
Without averaging, pulse width and duty cycle settings resulting in less than
about 30 milliseconds PRP will not change the actual system PRP.
With averaging, pulse width and duty cycle settings resulting in less than
about 1 millisecond PRP will not change the actual system PRP.
To learn more about control of these values, refer to the General Timing
Information chapter.
5-8 Operating the HP 8510 for Pulsed-RF Measurements
External Triggering Check
Connect the output of the external pulse generator to the HP 8510 rear panel TRIGGER IN
connector and to the RF source PULSE MODULATION INPUT (Figure 9-1). Set the pulse
generator to deliver a continuous TTL pulse train, going low for at least 100 nanoseconds at
any pulse repetition period less than about 1 millisecond. Activate the pulse generator pulse
output.
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Press 4STIMULUS MENU5 MORE TRIGGER MODE TRIGGERING EXTERNAL .
The network analyzer should sweep normally in either the frequency domain or the pulse
pro le domain. The analyzer is not aected by excess trigger inputs.
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Press 4DOMAIN5 PULSE PROFILE . The trace represents the signal at the RF source Pulse
Modulation Input. The signal level is high when the pulse is On and low when the pulse is
O.
Press 4MARKER5 then move the marker to various points on the trace.
Adjust the time span and number of points for the desired display. Notice that the
measurement resolution period is set by the pulse width, stop time, and number of points.
NNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNN
Press 4DOMAIN5 FREQUENCY . If the W annotation does not appear, press 4SYSTEM5 MORE
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PULSE CONFIG DETECTOR: WIDE BW .
Press 4MARKER5 then move the marker to various points on the trace.
In the frequency domain, adjust the trigger delay so that the measurement takes place at the
desired time after the falling edge of trigger in.
You may also monitor the rear panel STOP SWEEP output with an oscillosope. Stop Sweep
goes high to indicate that the HP 8510 is ready to make the measurement. Change the period
of Trigger In and Pulse Modulation Input and notice the timing of the Stop Sweep. The HP
8510 Pulse Output is not active when external triggering is selected.
Operating the HP 8510 for Pulsed-RF Measurements 5-9
6
Frequency Domain Point-in-Pulse Measurements
This chapter contains measurement calibration and measurement procedures to display the
pulsed-RF S-parameters versus frequency.
Measurement Calibration for Point-in-Pulse
Measurement calibration for point-in-pulse is accomplished in exactly the same way as for the
standard HP 8510.
NNNNNNNNNNNNNNNNNNNNNNNNNNNNN
1. Press 4DOMAIN5 FREQUENCY to select the frequency domain. If the W annotation is not
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displayed, select the wideband detector by pressing 4SYSTEM5 MORE PULSE CONFIG
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
DETECTOR: WIDE BW .
2. Select the maximum number of points required for the measurement, then perform the
appropriate measurement calibration.
Note for internal triggering, when you press the key to measure the calibration standard, the
HP 8510 pulse output signal is set to the active state (RF always On) during measurement of
the standard. This assures that the calibration is made with respect to the On portion of the
pulse independent of the trigger delay.
Note for external triggering, you control the pulse width and duty cycle during calibration and
measurement. You must set the trigger delay to make the measurement at the correct time
during the pulse for calibration, then not change it during the measurement.
Measurement
Set Pulse Polarity
After instrument preset, the pulse polarity is set to High for the On period of the pulse
appearing at the HP 8510 rear panel PULSE OUTPUT connector. Use the following
procedure to set the pulse polarity.
NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Press: 4SYSTEM5 MORE PULSE CONFIG PULSE OUT: HIGH or PULSE OUT: LOW .
Frequency Domain Point-in-Pulse Measurements 6-1
Set Pulse Width
After instrument preset, the pulse width is set to 10 microseconds. Use the following
procedure to set a dierent pulse width.
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Press PULSE WIDTH . Use the knob, step keys, or numeric entry to set the desired pulse
width.
Set Duty Cycle Limit
After instrument preset, the duty cycle limit is set to 10%. This means that the maximum
duty cycle will never be allowed to be greater than 10 percent regardless of the pulse width.
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
To set the duty cycle limit, press DUTY CYCLE on the Pulse Con guration menu. Use the
knob, step keys, or numeric entry to set the desired maximum duty cycle limit. Note that
the actual duty cycle may be less.
Set Trigger Delay
After Preset, the trigger delay is set to 5 microseconds. This means that the frequency
domain measurement will take place 5 microseconds after time zero. Time equals zero seconds
is when the HP 8510 pulse output goes to the active level turning on the pulse modulator.
Use the following procedure to set the trigger delay.
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Press 4STIMULUS MENU5 MORE TRIGGER MODE TRIGGER DELAY , then use the knob, step keys,
or numeric entry to set the desired trigger delay.
Notice that if the trigger delay is set to outside the time interval that the pulse is On, the
trace is noisy due to low signal levels.
Connect the Device Under Test
Figure 6-1 shows the response of the device to the pulsed-RF stimulus over the current
frequency sweep.
6-2 Frequency Domain Point-in-Pulse Measurements
Figure 6-1. Amplifier Gain, Frequency Domain Point-in-Pulse
The dynamic range can be increased using IF averaging, but, given the system noise oor with
the wide IF bandwidth, an averaging factor of about 256 averages is the maximum value that
should be used. In general, using an averaging factor greater than 256 will not result in any
increase in visible dynamic range.
Frequency Domain Point-in-Pulse Measurements 6-3
7
Pulse Profile Domain Measurements
This chapter contains measurement calibration and measurement procedures to display the
pulsed-RF S-parameters versus time.
Measurement Calibration for Pulse Profile
After selection of the pulse pro le frequency, measurement calibration for pulse pro le
measurements is accomplished in exactly the same way as for the standard HP 8510.
Following are two measurement calibration methods, one for calibration in the Pulse Pro le
domain, and the second for calibration using the Frequency List feature. Select the best one
for your application.
The pulse pro le domain calibration procedure is an easy way to familiarize yourself with
the pulse pro le domain and for general-purpose measurements using simple response-only
correction.
Use the frequency list technique when more than one pulse pro le frequency and 1-Port or
2-Port correction is required. Given adequate signal levels, accurate timing, and frequency
stability, there is essentially no dierence in the accuracy of the pulse pro le measured data
whether the calibration is performed in the pulse pro le domain as described in the rst
procedure or in the frequency domain as described in the second procedure. The main
advantage of calibration in the frequency domain is that you can calibrate at all frequencies in
the list while only connecting the standards once.
Pulse Profile Domain
Perform measurement calibration in the pulse pro le domain as follows.
1. Turn correction o by pressing 4CAL5 CORRECTION OFF .
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2. Press 4DOMAIN5 FREQUENCY to select the frequency domain. Press 4STIMULUS MENU5 STEP to
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select the sweep mode.
3. Press 4START5 then set the start frequency to the desired pulse pro le frequency. This will
be the frequency measured when the pulse pro le domain is selected.
4. Press PULSE PROFILE on the Domain menu. Press 4MARKER5 and notice that the active
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function readout shows both the time value at the marker position and the current
measurement frequency.
Pulse Profile Domain Measurements 7-1
5. Select the maximum number of points required for the measurement, then perform the
appropriate measure- ment calibration.
Note that the HP 8510 pulse output is set to the active state (RF always On) during
measurement of the calibration standards. For external triggering, the pulse modulation is
operating during the calibration, so the pulse width or time span cannot be changed after
calibration.
6. For the next pulse pro le frequency repeat this sequence.
With several cal sets created in this way, you can select each pulse pro le frequency in turn by
recalling the corresponding cal set.
Frequency Domain Using Frequency List
In the above measurement calibration procedure it is necessary to perform a separate
calibration for each pulse pro le frequency. This is not a problem for simple response-only
calibrations, but when accuracy considerations require the use of 1-Port or 2-Port calibrations,
connecting the necessary sequence of standards repeatedly can be tedious. As an alternative,
the frequency list feature allows the standards to be connected once for all pulse pro le
frequencies.
Perform the calibration as follows.
NNNNNNNNNNNNNNNNNNNNNNNNNNNNN
1. Press 4DOMAIN5 FREQUENCY to select the frequency domain.
If the W annotation is not displayed, the wideband detector must be selected before
proceeding.
2. Press 4SYSTEM5 MORE PULSE CONFIG DETECTOR: WIDE BW .
NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
3. Press 4STIMULUS MENU5 MORE EDIT LIST to display the Edit List menu. Create a segment
NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNN
for each pulse pro le frequency to be measured. Each segment is de ned such that the
start and stop frequencies are identical and the number of points in each segment is the
number of points to be displayed in the pulse pro le measurement. For example, the
following sequence creates a frequency list to measure four pulse pro le frequencies, of 51
points each.
a. Press ADD 4START5 435 4G/n5 NUMBER of POINTS 455 415 4x15 DONE .
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b. Press ADD
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4START5 445 4G/n5 4x15 DONE .
c. Press ADD
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4START5 455 4G/n5 4x15 DONE .
d. Press ADD
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4START5 465 4G/n5 4x15 DONE .
e. Press DONE FREQUENCY LIST . The frequency list will be measured.
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Figure 7-1 shows the resulting display. Proceed with the appropriate measurement
calibration.
7-2 Pulse Profile Domain Measurements
Figure 7-1. Frequency List Display During Measurement Calibration
4. Press 4DOMAIN5 PULSE PROFILE
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5. Press 4STIMULUS MENU5 FREQUENCY LIST SINGLE SEGMENT .
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The last selected segment will be active.
Figure 7-2. Pulse Profile, Frequency List Segment Number 1
Pulse Profile Domain Measurements 7-3
6. To measure another frequency, select the appropriate active segment.
When either of these calibration procedures is complete, the device can be connected for
measurement.
Again, in both of these procedures, note that when you press the key to measure the
calibration standard, the HP 8510 pulse output is set to the active state (RF always On)
during measurement of the standard. This ensures that the calibration data at every point is
with respect to the On portion of the pulse.
Measurement
After calibration, rst view the response of one of the calibration standards. Figure 7-3 is
typical: the trace is at at 0 dB when the pulse is On, and noisy around 0 dB when the pulse
is O. The noise during pulse O will vary depending upon the relative signal levels in the
reference and test signal paths.
Figure 7-3. S21, Pulse Profile, Thru
Set Pulse Polarity
After instrument preset, the pulse polarity is set to High for the On period of the pulse
appearing at the HP 8510 rear panel PULSE OUTPUT connector. Use the following
procedure to set the pulse polarity.
NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Press 4SYSTEM5 MORE PULSE CONFIG PULSE OUT: HIGH or PULSE OUT: LOW .
7-4 Pulse Profile Domain Measurements
For internal pulse modulation and internal triggering, time equals zero seconds is always the
point where the pulse transitions to the active level. The internal pulse modulator in the RF
source turns the RF pulse On when the analyzer output is positive, so the noisy part of the
trace will change location depending on the pulse polarity.
Set Pulse Width
After instrument preset, the pulse width is set to 10 microseconds. To set a dierent pulse
width:
NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Press 4SYSTEM5 MORE PULSE CONFIG PULSE WIDTH .
Use the knob, step keys, or numeric entry to set the desired pulse width.
Set Duty Cycle Limit
After instrument preset, the duty cycle limit is set to 10%. This means that the maximum
duty cycle will never be allowed to be greater than 10 percent regardless of the pulse width.
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
To set the duty cycle limit, press DUTY CYCLE on the Pulse Con guration menu. Use the
knob, step keys, or numeric entry to set the desired maximum duty cycle limit. Note that the
actual duty cycle may be less.
Set Measurement Time Span
The HP 8510 automatically chooses the minimum possible (given the HP 8510 hardware
and rmware capabilities) time between samples, and thus the measurement resolution
period, depending upon the larger of the pulse width time or the stop time. This results in a
minimum possible span time which depends upon the current number of points.
To view the pulse with minimum sample resolution period and thus the best time resolution,
press 4STOP5, then repeatedly press the 9 key until the time value at the bottom of the grid
does not change (or enter 4STOP5 405 4x15). This also sets the start time to the minimum value.
If the pulse is longer than this time span, increase the stop time to view the entire time period
of interest.
Set Measurement Resolution Period
To nd the resolution period, press 4MARKER5, then move the marker one data point and see
the time change in the Active Entry area. If necessary, adjust the resolution period to the
value required for your measurement by changing the stop time, pulse width, and number of
points.
Connect the Device under Test
With the pulse width set, connect the device under test. Figure 7-4 shows the response of the
device to the pulsed-RF stimulus at the current frequency.
Pulse Profile Domain Measurements 7-5
Figure 7-4. Minimum Time Span, Resolution Period = 100 ns
To measure another frequency, recall the appropriate cal set or frequency list segment,
depending upon the calibration procedure used.
Figure 7-5 shows the S11 response using the Smith chart format. The marker is showing the
input impedance during the On time of the pulsed-RF stimulus.
Figure 7-5. S11, Smith Chart
7-6 Pulse Profile Domain Measurements
Switching Between Frequency Domain and Pulse Profile Domain
The domain in which the measurement calibration was performed is not part of the cal set
limited instrument state. This means that, for example, a cal set created in the frequency
domain could be turned on for a pulse pro le domain measurement with no message to the
operator. Except for the pulse pro le calibration procedure in the frequency domain using
Frequency List, a cal set should only be used in the domain in which it was created.
Press the following keys to switch between the frequency domain and the pulse pro le domain.
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
4CAL5 CORRECTION OFF 4DOMAIN5 FREQUENCY or PULSE PROFILE
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4CAL5 CORRECTION ON CAL SET n
This sequence makes certain that the cal set applies to the domain in which it was created.
Another method is to save a number of instrument states, each with the appropriate domain
and cal set, then simply recall the desired instrument state.
If a cal set created in the pulse pro le domain is turned On while in the frequency domain, it
is treated as if the calibration were pe