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NEW MEASUREMENT TECHNIQUES
FOR TESTING BOTH LINEAR AND
NONLINEAR DEVICES WITH THE
HP 8753B RF NETWORK ANALVZER
Barry Brown
Network Measurements Division
1400 Fountaingrove Parkway
Santa Rosa, California 95403
RF & Microwave
Measurement
Symposium
and
Exhibition
Flin- HEWLETT
a:~ PACKARD
www.HPARCHIVE.com
ABSTRACT
NEW MEASUREMENT TECHNIQUES FOR TESTING BOTH LINEAR AND
NONLINEAR DEVICES WITH THE HP8753B RF NETWORK ANALYZER
Nonlinear devices, like amplifiers and mixers. require more complicated test procedures than
linear devices. Thorough testing of these devices includes the measurement of harmonic
distortion, gain compression. conversion loss, and two-tone intermodulation distortion, in addi-
tion to linear parameters like gain or insertion loss, bandwidth. group delay, reflection coeffi-
cient, reverse isolation. and so forth. This paper describes how to make these measurements,
utilizing the powerful new capabilities of the HP8753B Vector Network Analyzer. Detailed
measurement setups and the proper techniques for best accuracy are discussed, along with
many practical examples.
AUTHOR
Barry Brown, Hardware Design Engineer. Hewlett-Packard Network Measurements Division,
Santa Rosa, California. BSEE. Purdue University: MSEE, Stanford University. With
Hewlett-Packard since 1976, Barry has done analog and RF circuit design for the HP851 0
and HP8753 network analyzers. along with system evaluation of these products. He is cur-
rently invol\-ed in the definition of the next generation of RF net work analyzers.
www.HPARCHIVE.com
NEW MEASUREMENT TECHNIQUES
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FOR TESTING BOTH LINEAR AND
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NONLINEAR DEVICES WITH THE I
HP 8753B RF NETWORK ANALYZER I
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This paper examines the measurement of
some nonlinear parameters of amplifiers
OleJlECliu IES and mixers with the HP8753B Network
Analyzer. Because these are more complex