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Technical Optoelectronics Test
Information
Active optoelectronic device a very small, precise reverse current (10nA)
characterization requires more while measuring the voltage. The limited cur- Imeter/Compliance Local IN/OUT HI
than a current source rent prevents permanent damage to the device, Remote SENSE HI
while allowing a precise breakdown voltage to Vsource Vmeter
Forward
L be measured. Given the breakdown voltage, it's DUT
Voltage
(VF) V now possible to force a reverse bias that won't Feedback to
Adjust Vsource
Back Facet IBD harm the device while leakage is measured. This Remote SENSE LO
Detector
Current dL/dIF leakage current value is often used to qualify the Local IN/OUT LO
device for further testing.
Technical information: Optoelectronics test
(IBD) A
VF
Light Power
Output Four-quadrant source capabilities
(L) mW Figure 5. In voltage source mode, a
Kink Test +1A SourceMeter SMU instrument forces a voltage
(dL/dIF)
and measures current. Remote sense of the
IF
Forward Current (IF) mA
voltage ensures the desired voltage at the
+100mA DUT.
Figure 1. Classic LIV curves associated with
semiconductor laser diodes.