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DESCRIPTION
The AP034 is a wide-band, active differential probe. The probe
features low noise, low input capacitance, high common mode
rejection, and Field Effect Transistor (FET) buffered inputs in the
probe head. The user-selectable offset gives the probe the
flexibility to measure a large range of signal types. Plug-on
attenuators and AC coupling accessories further extend the
application range. Included interconnect accessories allow
connection to surface mount and through-hole components with
minimal signal degradation. The input receptacles in the probe
head are compatible with standard 0.025 in. (0.635 mm) square
pins, which provide a convenient, low-cost method of creating
device characterization test fixtures.
The probe is powered directly from a LeCroy oscilloscope
through the ProBus interface. The ProBus interface also allows
local control of the probe through the oscilloscope user interface
and remote control through the interface buses, (GPIB, RS-232).
The optional ADPPS power supply allows the AP034 to be used
with other instruments such as spectrum analyzers, network
analyzers, and oscilloscopes without ProBus interface.
APPLICATIONS
The AP034 Active Differential Probe is ideal for acquiring high-
speed differential signals such as those found in disk drive read
channels, differential LAN, video, etc. The probe can be used
with spectrum analyzers to acquire signals in some RF systems
(for example, balanced IF mixers in hand-held cellular
telephones). The high impedance characteristics of both inputs
allow you to use the probe as an FET probe to make single-
ended measurements in digital systems without introducing a
ground loop, as a conventional FET probe would.
AP034-OM-E Rev D ISSUED: January 2000