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Now downloading free:Shenzhen Duoyi Electronics Co DY294


Download Shenzhen Duoyi Electronics Co DY294 docs - Measuring and test equipment,digital multimeters, analog multimeters, Fluke, Wavetek ... service manuals and repair information

File information:
File name:DY294_V3.pdf
[preview DY294] new window
Size:139 kB
Extension:pdf
MD5:73017f84ee1c7d65391c5e3ec3d0cc62
Mfg:

Shenzhen Duoyi Electronics Co

Model:

DY294

Original Chassis:294
Descr:Digital Transistor Tester, Digital Transistor DC Parameter Tester.
Group:Electronics > Measuring equipment >
Uploaded:2008-10-02 06:17:30
User:shareit
Multipart:No multipart

Information about the files in archive:
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Extracted files:1
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DY294_V3.pdf6. Testing methods for other components: a. The testing method for operating voltage drop of controlled silicon is the same as that for saturation voltage drop of common transistor in Vce (sat) step. The transistor with low voltage drop has low internal impedance and high output power. The testing method for operating current of controlled silicon is the same as that for transistor hFE step. The level of trigger current should be noted when testing controlled silicon. Insert A pole into C jack, G pole into B jack and K pole into E jack. b. Identify the output power level of transistor , controlled silicon and field effect transistor.Use Vce (sat) steps to test the transistor of the same model. The low saturation voltage drop indicates low internal impedance and high output power. c.To identify unidirectional controlled silicon and bidirectional controlled silicon, first use Vce (sat) or hEF steps of tester NPN to test. d.Identify damp of transistor. The V ( br ) step of the tester can

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