| 5991-2966EN Reducing Device-Failure Risk with a Black-Box Recorder - Application Note c20141107 [6]. | | Keysight Technologies
Reducing Device-Failure Risk
with a Black-Box Recorder
Application Note
Introduction
Protecting against damage in test for aerospace/defense and automotive devices -- or any
devices that are time consuming and costly to replace -- is essential to meeting delivery and
budget objectives. When the risk of device failure is of signiicant concern, test planning should
include strategies and equipment that can help you reduce the risk.
Even after planning carefully, taking extensive precautions, and executing a test plan step by
step, DUTs may still fail. DUTs may fail for a variety of reasons beyond DUT laws, among them
human error, test equipment failure, and controller failure. When a failure occurs, you need to
identify and understand the failure mechanism to avoid a repeat. Better still is to detect con-
ditions that can lead to DUT failure and to act to prevent damage. The Keysight Technologies, Inc.
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