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Now downloading free:Agilent 5991-2966EN Reducing Device-Failure Risk with a Black-Box Recorder - Application Note c20141107 [6]


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[preview 5991-2966EN Reducing Device-Failure Risk with a Black-Box Recorder - Application Note c20141107 [6]]
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5991-2966EN Reducing Device-Failure Risk with a Black-Box Recorder - Application Note c20141107 [6].Keysight Technologies Reducing Device-Failure Risk with a Black-Box Recorder Application Note Introduction Protecting against damage in test for aerospace/defense and automotive devices -- or any devices that are time consuming and costly to replace -- is essential to meeting delivery and budget objectives. When the risk of device failure is of signiicant concern, test planning should include strategies and equipment that can help you reduce the risk. Even after planning carefully, taking extensive precautions, and executing a test plan step by step, DUTs may still fail. DUTs may fail for a variety of reasons beyond DUT laws, among them human error, test equipment failure, and controller failure. When a failure occurs, you need to identify and understand the failure mechanism to avoid a repeat. Better still is to detect con- ditions that can lead to DUT failure and to act to prevent damage. The Keysight Technologies, Inc.



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