Keithley 2949 Wafer Level Test free download

File name 2949_Wafer_Level_Test.pdf

A GREAT ER M EA SU R E O F C O N F I D E N C E (TEGs) will be covered in a subsequent article. 2. Particularly for new device technologies, it's essential to establish a measurement baseline using sequential testing prior to implementing parallel test. Variations in device performance are more common with new technologies than with existing ones. Given that one of the objectives of parametric testing is to understand where the variations in the process are and then to reduce them through the development process, it's critical to establish this sequential test baseline; parallel testing may introduce additional variations as Implementation a result of either tester timing or device interference. Without a sequential test baseline for comparison, it's impossible to of Wafer Level distinguish between "new device" varia- tions and "parallel test" variations. When using a