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Agilent In-Fixture Characterization Using the ENA Series RF Network Analyzer with Cascade Microtech Probing System Product Note E5070/71-4 Introduction On the other hand, de-embedding This product note explains a new Many different techniques have uses a model of the test fixture to approach to in-fixture characteri- been developed for eliminating the mathematically remove unwanted zation using the Agilent ENA influence of test fixtures from test fixture effects from the overall Series RF network analyzer with measurement results. These can measurement results. Usually, de- Cascade Microtech's probing sys- be classified into two fundamental embedding data can be obtained tem. This solution can drastically approaches. One is performing from the simulation results of the reduce your characterization time, calibration at the tips of a test test fixture model, which is mod- especially for multiport test fix- fixture's electrodes and the other eled with simulation tools such as tures. By using this new approach, is de-embedding characterized test the Agilent Advanced Design you can easily obtain fixture char- fixture models. The first method System (ADS); however, accurate acteristics data without modeling requires customized calibration test fixture modeling is difficult complex multiport test fixtures. standards for each test fixture, and time-consuming. Therefore, This product note also compares which are very expensive and engineers have been seeking an the new in-fixture characteriza- inflexible. easy and accurate in-fixture tion method with the de-embed- characterization method. ding technique using ADS. 1. System configuration The recommended system configu- ration of an in-fixture characteri- zation system using the ENA Series a