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Characterization of Frequency Agile Sources Rex Chappell Santa Clara Division RF & Microwave Measurement Symposium and Exhibition FliDW HEWLETT ~~ PACKARD www.HPARCHIVE.com ABSTRACT: This paper describes techniques for testing fast-switching frequency-agile sources, such as frequency hopping radios and synthesizers. Using the new HP 5371A Frequency and Time Interval Analyzer, dynamic, at-speed testing of these devices is now possible. Single-pass characterization techniques for five important device parameters will be discussed; 1) hopping sequency analysis, 2) switching transient analysis, 3) settling time verification, 4) hopping frequency distribution, and 5) carrier modulation analysis. AUTHOR: Rex Chappell, Product Marketing Engineer for Universal Counters, Santa Clara Division, BSEE, San Jose State, 1970. With HP since 1973 in various marketing positions: RSE, Product Support, European Sales Development Engineer, Logic Test PME, and Universal Counters PME since 1985. www.HPARCHIVEcom , , , - - - - - - - - - - - - - - - - - - - - - -... "" This paper will cover new techniques and tools for char- acterizing frequency-agile source parameters that were previously difficult or impossible to quantify. Characterization of Frequency Agile Sources Rex Chappell Santa Clara Division For the purposes of this paper, a frequency-agile source will be dermed as a source that changes its output fre- Agile Carrier quency in a serial way with time. An example is a veo that is driven by a series of voltage steps. Time Dom"i