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Agilent
Correlation of Simulation versus
Measurement in Frequency
and Time Domain
White Paper
Contents
Overview ................................................................................................... 2
Measurement Equipment ...................................................................... 3
TDR Measurements ................................................................................. 3
Frequency Domain Correlation Results ............................................. 5
Comparison with Agilent TRL Calibration ........................................ 10
Measured Time Domain Results at 3.125 Gbps.................................. 12
Number of Bits Sampled by the Oscilloscope .................................... 14
Simulated Time Domain Results at 3.125 Gbps ................................ 15
Conclusions ............................................................................................. 16
Agilent Physical Layer Test System Configuration Guide................ 18
Web Resources ......................................................................................... 19
Acknowledgment ..................................................................................... 19
Overview
A measurement/simulation correlation effort was launched between Agilent
Technologies and Cadence Design Systems to validate the new technology
developed in the new Cadence Allegro PCB SI 630 product, which was used
to produce all simulated data in this paper. The test vehicle consisted of a
production Advanced Telecomm Computing Architecture (ATCA) backplane
from Kaparel Corporation (a mutual Agilent/Cadence customer), and
adaptor cards developed by Agilent, which plug into the backplane and
provide surface mount SMA test access. The backplane has 18 layers with a
nominal thickness of 125 mils, and uses the Z-PACK HM-Zd 4-pair connector
from Tyco Electronics. A picture of the test configuration is shown in
Figure 1. A stripline path of approximately 19" through the backplane was
studied to correlate simulation vs. measured results in the frequency and
time domain.
Agilent
adapter
card
Kaparel
backplane
Tyco HM-Zd
connector
Figure 1. Test configuration
2
Measurement Equipment
All measurements were taken by Agilent Technologies. The Agilent
equipment used was the following: