Agilent 1960-12 free download

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HEWLETT-PACKARD JOURNAL TECHNICAL INFORMATION FROM THE -dp- LABORATORIES Vol. 12. No. 4 BLISHED BY THE HEWLETT-PACKARD COMPANY, 1501 PAGE MILL ROAD, PALO ALTO, CALIFORNIA DECEMBER, 1960 Improved Sweep Frequency Techniques for Broadband Microwave Testing THE introduction of reflectometer methods and of There are many cases in the industry today where the voltage-tuned microwave sweep generator1 3 microwave components leave a manufacturing plant made available to the microwave engineer what has still containing narrow band "resonance" type ab become a popular tool for rapidly gathering quanti sorptions or reflections that are outside the limit tative information on microwave device perform specified by the manufacturer. It is obvious in these ance over broad frequency ranges. Over a period of cases that the production tests were made on a point- time several improvements in techniques have been by-point basis and that the narrow-band "spike" was made and are presented in this article. These new missed. Indeed, it would be very expensive to test the techniques apply to measurements both of reflection components at the number of single frequencies re coefficient and of attenuation. They are suitable for quired to insure the absence of narrow resonances, rapid and accurate full-range production testing of -hp-, on the other hand, in line with its philosophy microwave components on a go-no go basis. They of "inexpensive quality," uses these sweep-frequency have been in use in the -hp- microwave test depart methods on production components to assure full- range performance. ment for several years; indeed, it has been through 'J. K. Hunton and N. L. Pappas, "The -hp- Microwave Reflectometers," the eff