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Now downloading free:Agilent 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4]


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5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4].pdfKeysight Technologies High Resolution Imaging with Keysight 7500 AFM Application Brief Introduction Atomic force microscopy (AFM) was developed as a high resolution surface imaging technique, capable of imaging and probing mate- rial structures at the atomic or molecular level. The capability of obtaining high resolution images with ease on different materials, using various imaging methods such as contact and AC mode, has become expected for high performance scanning probe micros- copy (SPM) systems. On the other hand, the multitude of SPM ap- plications have also become more demanding in accurate position- ing and correct dimensional measurement. Consequently, a large range scanner (greater than 90

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