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| File name: | E6706F 1xEV-DO Lab Application - Technical Overview 5991-2369EN c20130426 [16].pdf [preview E6706F 1xEV-DO Lab Application - Technical Overview 5991-2369EN c20130426 [16]] |
| Size: | 969 kB |
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| Mfg: | Agilent |
| Model: | E6706F 1xEV-DO Lab Application - Technical Overview 5991-2369EN c20130426 [16] 🔎 |
| Original: | E6706F 1xEV-DO Lab Application - Technical Overview 5991-2369EN c20130426 [16] 🔎 |
| Descr: | Agilent E6706F 1xEV-DO Lab Application - Technical Overview 5991-2369EN c20130426 [16].pdf |
| Group: | Electronics > Other |
| Uploaded: | 27-08-2020 |
| User: | Anonymous |
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| Decompress result: | OK | |
| Extracted files: | 1 | |
File name E6706F 1xEV-DO Lab Application - Technical Overview 5991-2369EN c20130426 [16].pdf E6706F 1xEV-DO Lab Application For the 8960 Series 10 (E5515C/E) Wireless Communications Test Set Technical Overview Achieve reliable high As the first one box test set solution to support 1xEV-DO, 1xEV-DO Release A, Release B, and eHRPD, the Agilent Technologies E6706F 1xEV-DO lab applica- data rate testing results tion in conjunction with the 8960 Series 10 (E5515C/E) wireless communica- and gain confidence in tions test set provides a wide range of parametric and functional test capabili- ties for 1xEV-DO. The E6706F is designed for use in many stages of the mobile your 1xEV-DO wireless device development lifecycle, with the capacity to meet both RF and functional access terminals testing needs. This test solution improves the problem-solving efficiency of R&D engineers who design, integrate, verify, and validate leading-edge 1xEV-DO wire- less access terminals (ATs). Key Features | ||

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