Agilent 5990-9430EN Surviving State Disruptions Caused by Test A Case Study - Article Reprint c20140730 [16 free download

File name 5990-9430EN Surviving State Disruptions Caused by Test_ A Case Study - Article Reprint c20140730 [16

Keysight Technologies Surviving State Disruptions Caused by Test: A Case Study Kenneth P. Parker, Keysight Technologies Shuichi Kameyama1, Fujitsu Limited David Dubberke, Intel Corporation 1. Also with Ehime University, Matsuyama, Ehime, Japan. Abstract The practice of initializing a board or system for testing purposes is not an exact science, but rather, pursued empirically and with an increasing risk of undesired side effects. It has been suspected that Boundary-Scan testing can cause such side effects. This paper provides a case study of such a board where a detailed root-cause analysis was performed. Some issues are identified that justify add- ing features to IEEE 1149.1 that will facilitate safe, fast and effective initializa- tion of a board or system, to get it ready for testing and to leave it in a safe state upon completion of testing. 1 Disclaimer There is a Working Group for IEEE 1149.1 that is revising the standard and could implement some of the ideas presented in this paper (see [IEEEWG]). The con- tent of this paper may not reflect the group's final thinking and results. Opinions stated throughout this paper are those of the authors. Copyright