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Now downloading free:Agilent 5991-3193EN Reliable Temperature Chamber Testing with N2797A Extreme Temperature Active Probe - Appl

Agilent 5991-3193EN Reliable Temperature Chamber Testing with N2797A Extreme Temperature Active Probe - Appl free download

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Descr: Agilent 5991-3193EN Reliable Temperature Chamber Testing with N2797A Extreme Temperature Active Probe - Application Note c20141003 [5].pdf
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File name 5991-3193EN Reliable Temperature Chamber Testing with N2797A Extreme Temperature Active Probe - Appl

Keysight Technologies Reliable Temperature Chamber Testing with N2797A Extreme Temperature Active Probe Application Note 02 | Keysight | Reliable Temperature Chamber Testing with N2797A Extreme Temperature Active Probe - Application Note Many engineers today need to verify their products' performance over a wide range of operating temperatures. Until now, testing in extreme temperature ranges required engineers to use probes outside their specified operating temperatures, which can damage probes. Whether active or passive, most probes have a specified operating temperature range from 0 to 50 degrees Celsius. The new Keysight Technologies, Inc. N2797A extreme temperature active probe can operate over a much wider range, from -40 to 85 C. Engineers can operate the probe head and the supplied probing accessories inside a temperature chamber, with the probe pod and oscilloscope located outside the temperature chamber. Reliability temperature testing is very import- ant in the electronics design process. It helps to detect product failure in the early stages; figure out reasonable calibration/warranty time; and understand the product's long term performance under extreme temperature conditions. The electronics industry classifies temperatures into three general ranges. First is a so-called standard range or commercial grade, over which products are fully warrant- ed and typically span from 0



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