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Now downloading free:Agilent Optimize burn-in test with the Keysight 34980A multifunction switch measure unit apnote overview 599

Agilent Optimize burn-in test with the Keysight 34980A multifunction switch measure unit apnote overview 599 free download

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Descr: Agilent Optimize burn-in test with the Keysight 34980A multifunction switch measure unit apnote overview 5991-1815EN c20140725 [5].pdf
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File name Optimize burn-in test with the Keysight 34980A multifunction switch measure unit apnote overview 599

Keysight Technologies Optimize Burn-in Test with the 34980A Multifunction Switch/ Measure Unit Application Note Abstract Demanding applications in process automation, power generation and public transport require extensive device burn-in to minimize early defect rates. Test engineers in the power generation and large drive control business must of- ten test 100% of the printed circuit board assemblies before integrating them into complex products. The efficiency of a burn-in test process is key to the management of overall cost of test. An efficient burn-in test system design takes into consideration instrument selection, programming, and a creative approach to power management. This applica- tion overview will discuss the complexities of burn-in test and the solution created by LXinstruments, a Keysight Technologies, Inc. solutions partner, based on the Keysight 34980A switch/measure unit. Introduction To maximize the reliability of complex systems used in ap- Figure 1. The LXinstruments Burn-In Test System with the Keysight plications such as process automation, power generation 34980A Switch/Measure Unit. and public transport, burn-in test is essential to identify early defects. In many cases, burn-in test will be applied to all of the circuit boards or devices used in these systems. For accelerated life testing, the burn-in test procedures will be executed in an environmental chamber where the tem- perature of the device under test (DUT) can be cycled over many hours. The DUTs may be tested passively or actively. In both cases, power is applied; but, when testing actively, the device is also exercised with a test routine. The provision of individual power supplies for each DUT can be very costly and requires considerable physical Figure 2. Keysight 34959A breadboard module with LXinstruments space; however, sharing a common power supply between circuitry. all or a group of DUTs risks losing test time and data if an early failure in one DUT compromises the power supply to the rest. The solution developed by LXinstruments is to create a modular multiplexed architecture, based on the Keysight 34945A breadboard module for the 34980A Multifunction Switch/Measurement Unit, which allows the DUT's to be switched between common power supplies. This solution is fully scalable allowing it to cater to a varying number of DUTs, reducing the cost and physical space required. 2 Solution Solution details The Keysight 34980A Multifunction Switch/Measure The power supply multiplexer utilizes the capabilities Unit is a flexible, reliable switching and data acquisition of the Keysight 34959A breadboard module to provide 8 platform. The Keysight 34959A breadboard module can



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