Agilent Capacitance Method 252CFlat Plate 252C Liquid 252C Gel 252C Ultra Thin Film 252C Compound Film 252CD free download

File name Capacitance Method_252CFlat Plate_252C Liquid_252C Gel_252C Ultra Thin Film_252C Compound Film_252CD

Capacitance Method, Flat Plate, Liquid, Gel, Ultra Thin Film, Compound Film, Dielectric Constant and Dielectric Loss Tangent Measurement System System No. DPS17 Agilent Technologies and KEYCOM Corp. Specifications when used with E4980A Frequency 20Hz ~ 2MHz Permittivity 1.05 ~ 1000 Accuracy : 3% tan 0.001~0.1 Accuracy : 5% Measurement Process 1. Connect coaxial cables of the electrode to your E4980A. 2. Bring the high and low elec- trodes at the end of the coaxial cables into contact with each other to execute short calibra- tion, and separate the two to E4980A Precision LCR Meter and DPT-009 for sheet, liquid, gel execute open calibration. Ideal solution for r'/tan measurement of sheet, 3. Insert specimen between elec- trodes and start measurement. thin film, multi-layer thin film, liquid and gel ASTM, JIS Standard compliant Features Specimen examples KEYCOM offers variety of highly accu- DPT-009 : allows you to measure Prepreg rate measurement systems for dielectric samples of approx. 50 m ~ 2mm in Semiconductor wafer constant