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File name: | Fast fT-Ic Measurement Using the Keysight B2912A 5990-6895EN c20130107 [5].pdf [preview Fast fT-Ic Measurement Using the Keysight B2912A 5990-6895EN c20130107 [5]] |
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Model: | Fast fT-Ic Measurement Using the Keysight B2912A 5990-6895EN c20130107 [5] 🔎 |
Original: | Fast fT-Ic Measurement Using the Keysight B2912A 5990-6895EN c20130107 [5] 🔎 |
Descr: | Agilent Fast fT-Ic Measurement Using the Keysight B2912A 5990-6895EN c20130107 [5].pdf |
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Fast fT-Ic Measurement Using the Keysight B2912A 5990-6895EN c20130107 [5].pdf | Fast fT-Ic Measurement Using the Agilent B2900A Series of SMUs Technical Overview Agilent B2901/02/11/12A Precision Source/Measure Unit Agilent B2901A Precision SMU, 1ch, 100 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2902A Precision SMU, 2ch, 100 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2911A Precision SMU, 1ch, 10 fA resolution, 210 V, 3A DC/10.5 A pulse Agilent B2912A Precision SMU, 2ch, 10 fA resolution, 210 V, 3A DC/10.5 A pulse Introduction The cutoff frequency (fT) is an important parameter to understand the operating frequency range of a System Configuration through a bias-T (either built-in to |
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