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| File name: | RampRate QuasiCVAppNote1.pdf [preview RampRate QuasiCVAppNote1] |
| Size: | 335 kB |
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| MD5: | 75b3f9f18ba5527c4090ff08d901697d |
| Mfg: | Keithley |
| Model: | RampRate QuasiCVAppNote1 🔎 |
| Original: | RampRate QuasiCVAppNote1 🔎 |
| Descr: | Keithley Appnotes RampRate QuasiCVAppNote1.pdf |
| Group: | Electronics > Other > |
| Uploaded: | 04-12-2019 |
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| RampRate QuasiCVAppNote1.pdf | Number 2973 Application Note Using the Ramp Rate Method for Making Series Quasistatic C-V Measurements with the Model 4200-SCS Semiconductor Characterization System Introduction I Capacitor Capacitance-voltage (C-V) measurements are generally made using an AC measurement technique. However, some capacitance Force HI Force HI measurement applications require a DC measurement technique. These are called quasistatic C-V (or QSCV) measurements because they are performed at a very low test frequency, that is, A almost DC. These measurements usually involve steppi | |
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