| RampRate QuasiCVAppNote1.pdf | | Number 2973
Application Note Using the Ramp Rate Method for Making
Series Quasistatic C-V Measurements with the Model
4200-SCS Semiconductor Characterization System
Introduction
I Capacitor
Capacitance-voltage (C-V) measurements are generally made
using an AC measurement technique. However, some capacitance
Force HI Force HI
measurement applications require a DC measurement technique.
These are called quasistatic C-V (or QSCV) measurements
because they are performed at a very low test frequency, that is,
A
almost DC. |
