Keithley 200SCS Low Current Application Note free download

File name 200SCS Low Current Application Note.pdf

Number 2959 Application Note Optimizing Low Current Measurements Series with the Model 4200-SCS Semiconductor Characterization System Introduction IS FORCE HI Many critical applications demand the ability to measure very low currents--such as picoamps or less. These applications include determining the gate leakage current of FETs, testing RS sensitive nano-electronic devices, and measuring leakage current IM of insulators and capacitors. VS IOFFSET The Model 4200-SCS Semiconductor Characterization System, COMMON when configured with the optional Model 4200-PA Remote Preamp, offers exceptional low current measurement capability Current Source SMU or PreAmp with a resolution of 1E