| 4200-903-01 (C - May 2006)(QSG).pdf | | www.keithley.com
4200-SCS Semiconductor
Characterization System
Quick Start Guide
4200-903-01 Rev. C / May 2006
A G R E A T E R M E A S U R E O F C O N F I D E N C E
Model 4200-SCS
License Agreement
NOTICE TO USERS: CAREFULLY READ THE FOLLOWING LICENSE AGREEMENT (THE "AGREEMENT"). USE OF THE
SOFTWARE (THE "SOFTWARE") PROVIDED WITH THE 4200-SEMICONDUCTOR CHARACTERIZATION SYSTEM (THE
"4200-SCS") CONSTITUTES YOUR ACCEPTANCE OF THESE TERMS. IF YOU DO NOT AGREE WITH THE TERMS OF THIS
AGREEMENT, PROMPTLY RETURN THE SOFTWARE AND THE ACCOMPANYING ITEMS, INCLUDING ANY WRITTEN
MATERIALS AND PACKAGING, TO THE LOCATION WHERE YOU OBTAINED THEM FOR A FULL REFUND.
Grant of License
Keithley Instruments ("Keithley") grants to you, subject to the terms and conditions of this Agreement, a non-exclusive, non-transf |
