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| File name: | 2871 Probe Card WP.pdf [preview 2871 Probe Card WP] |
| Size: | 649 kB |
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| MD5: | 1c44f359487e94da2f61a259cb0f0445 |
| Mfg: | Keithley |
| Model: | 2871 Probe Card WP 🔎 |
| Original: | 2871 Probe Card WP 🔎 |
| Descr: | Keithley Appnotes 2871 Probe Card WP.pdf |
| Group: | Electronics > Other > |
| Uploaded: | 22-12-2019 |
| User: | Anonymous |
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| File name | Text | |
| 2871 Probe Card WP.pdf | WHITE PA P E R Probe card considerations when migrating to new testers Yang Pan Keithley Instruments, Inc. Introduction For on-wafer automatic parametric testers, the probe card is the interface between the test head and the device pads on the wafer, so it is key to achieving a successful electrical measurement. The probe cards specified by each of the two dominant parametric tester companies, Agilent and Keithley Instruments, are incompatible with the other's testers. Therefore, when fabs change to a new tester type, such as from an Agilent 4000 Series tester to a Keithley S600 | |
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