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Now downloading free:Agilent On-Wafer Parametric Measurement 4-On-Wafer Parametric Measurement c20130117 [1]


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On-Wafer Parametric Measurement 4-On-Wafer_Parametric_Measurement c20130117 [1].pdfExcerpt Edition This PDF is an excerpt from Chapter 4 of the Parametric Measurement Handbook. The Parametric Measurement Handbook Third Edition March 2012 Chapter 4: On-Wafer Parametric Measurement "One must learn by doing the thing; for though you think you know it, you have no certainty until you try." -- Sophocles Introduction The vast majority of parametric measurements are performed on-wafer. Obviously, this implies that you need some sort of a wafer prober to make these measurements. What is often missed by many engineers performing on-wafer parametric measurements are the profound effects

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