Keithley 2538 SimutaneousSourcing1 free download

File name 2538 SimutaneousSourcing1.pdf

A G R E AT E R M E A S U R E O F C O N F I D E N C E observed include heat-stress re-crystalliza- tion, thermal stress, and voltage drops under conditions of constant electrical power input (Joule heating effects). Another area that requires much test- ing grows out of new electronics packaging technologies. Ever-advancing electronics packaging technology drives a need to per- form testing of higher and higher density in- terconnects. With hundreds of test points in Speed Up Testing a large ball grid array (BGA), it has become impractical to test each point sequentially, yet accelerated life testing requires indepen- with Simultaneous dent testing of each ball. A concern for BGAs is electromigration due to current crowding, which requires individual electrical control Sourcing to maintain constant Joule heating as well as measure interconnect resistance. The chal- lenge is to do all this testing in a reasonable (affordable) length of time, and the solutions