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|052207_2Nano.pdf||A GREAT ER M EA SU R E O F C O N F I D E N C E voltage of the transistor increases due to the
built-in voltage in the gate capacitor; there-
fore, the drain current decreases.
Pulse testing can be one of two different
types: voltage or current pulsing.
Voltage pulsing produces much narrow-
er pulse widths than current pulsing. This
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