Keithley 2683 Asynch-Synch ParaTest1 free download

File name 2683 Asynch-Synch ParaTest1.pdf

A GREAT ER M EA SU R E O F C O N F I D E N C E the saved time to acquire significantly more data, providing greater insight into produc- tion processes. In most cases, the structures being tested in parallel are located within a single Test El- ement Group (TEG). Even among leading- edge IC manufacturers, very few have pro- gressed to the point of testing structures in different TEGs simultaneously. Implement- ing parallel test involves using the paramet- ric tester's controller to inter-leave execution of the multiple tests in a way that maximizes the use of processing time and test instru- mentation capacity that would otherwise be standing idle. With appropriate test struc- tures design, this multi-threaded* approach