File information: | |
File name: | 2950_Getting_Started_Test.pdf [preview 2950 Getting Started Test] |
Size: | 524 kB |
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Mfg: | Keithley |
Model: | 2950 Getting Started Test 🔎 |
Original: | 2950 Getting Started Test 🔎 |
Descr: | Keithley Appnotes 2950_Getting_Started_Test.pdf |
Group: | Electronics > Other |
Uploaded: | 25-02-2020 |
User: | Anonymous |
Multipart: | No multipart |
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Decompress result: | OK | |
Extracted files: | 1 | |
File name | Text | |
2950_Getting_Started_Test.pdf | A GREAT ER M EA SU R E O F C O N F I D E N C E structures. Improvements from 40% to 50% are possible with structure layouts designed to increase the potential for parallel test. In traditional (i.e., sequential) parametric test programs, each DUT is connected to the measurement |
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