Keithley 2530 Parallel Test free download

File name 2530 Parallel Test.pdf

A G R E AT E R M E A S U R E O F C O N F I D E N C E Fast integration (17ms) for signal averaging is used, and the fab's philosophy dictates opti- mizing test structures for data integrity. Test devices share few probe contact pads and the scribe line test insert isn't optimized for minimum area, allowing significant parallel- ism with existing test structures and probe cards. Parallel testing let this fab achieve 1.7