|S530 FlashMemPulseAppNote.pdf|| Number 3177
Application Note Programming and Erasing Flash Memory
Series Devices Using the Keithley S530 Pulse
Introduction and Background storage density and is by far the most dominant of the two types,
so this note will focus on NAND flash memory.
Normally, in parametric test, the instrument used most is the
Source Measurement Unit (SMU). The SMU allows supplying In addition to the floating gate, NAND flash memory cells
a DC voltage or current to the device under test (DUT) and (Figure 1) usually have a control gate, drain, source, and bulk.
simultaneously measuring the resultant voltage or current. The memory cell is set (programmed) and reset (erased) by