| RingOscilators530AppNote.pdf | | Number 3169
Application Note Making Ring Oscillator Measurements
Series with the Model S530 Parametric Test
System's Frequency Measurement Option
Introduction
(a) Vdd
In the world of CMOS wafer parametric testing, the ring
oscillator is one of the more important test structures because its
test data helps confirm that logic gates are meeting their speed
design criteria. This application note discusses techniques for
testing these devices using Keithley's Model S530 Parametric Vosc
Test System.
Background
A growing number of semiconductor fabs are incorporating ring (b)
oscillators into their overall process control monitoring test
structures. Frequ |
