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File name:	RingOscilators530AppNote.pdf [preview RingOscilators530AppNote]
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Mfg:	Keithley
Model:	RingOscilators530AppNote 🔎
Original:	RingOscilators530AppNote 🔎
Descr:	Keithley Appnotes RingOscilators530AppNote.pdf
Group:	Electronics > Other >
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RingOscilators530AppNote.pdf		Number 3169 Application Note Making Ring Oscillator Measurements Series with the Model S530 Parametric Test System's Frequency Measurement Option Introduction (a) Vdd In the world of CMOS wafer parametric testing, the ring oscillator is one of the more important test structures because its test data helps confirm that logic gates are meeting their speed design criteria. This application note discusses techniques for testing these devices using Keithley's Model S530 Parametric Vosc Test System. Background A growing number of semiconductor fabs are incorporating ring (b) oscillators into their overall process control monitoring test structures. Frequency measurements on ring oscillator structur

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