Keithley 2762 Short Pulse free download

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A G R E AT E R M E A S U R E O F C O N F I D E N C E Technology and Economics Drive Testing Needs Accelerated testing such as HCI and NBTI can quickly generate curves that are extrapolated to predict operating lifetime and thereby provide insight into device de- sign and manufacturing processes. The most Short Pulse Testing efficient method is to over-stress the device, measure degradation trends of key operating parameters, and extrapolate the data to the Mandatory for full lifetime (Figure 1). However, it doesn't help if the extrapola- tion isn't representative of the way a device Semiconductor is going to be used. For example, NBTI deg- radation can relax when gate voltage stress is Reliability turned off. Then drain current and threshold voltage may recover and change back toward their original values