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Now downloading free:Keithley OptimizingDiodeThroughputArticle-EP&T

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OptimizingDiodeThroughputArticle-EP&T.pdfINCREASING TEST THROUGHPUT WITH BETTER INSTRUMENT COORDINATION Andy Armutat Keithley Instruments The built-in intelligence and programmability of today's source-measure units can greatly improve test throughput. Testing speed is important for all electronic components, but it is vital for low-price two- and three-terminal devices like diodes and transistors. Most types of diodes, for example, are tested for at least three basic DC parameters during final inspection: Forward Voltage (VF), Breakdown Voltage (VR), and Leakage Current (IR). These tests must be accurate and quick. Most of these tests require several instruments, such as a DMM, voltage source, and current source. However, using multiple instruments takes up more rack space than a system with all these functions in one unit. Three separate instruments also mean three sets of commands to learn, plus complicating syste

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