|OptimizingDiodeThroughputArticle-EP&T.pdf|| INCREASING TEST THROUGHPUT WITH
BETTER INSTRUMENT COORDINATION
The built-in intelligence and programmability of today's source-measure units can greatly
improve test throughput.
Testing speed is important for all electronic components, but it is vital for low-price two- and
three-terminal devices like diodes and transistors. Most types of diodes, for example, are tested
for at least three basic DC parameters during final inspection: Forward Voltage (VF), Breakdown
Voltage (VR), and Leakage Current (IR). These tests must be accurate and quick.
Most of these tests require several instruments, such as a DMM, voltage source, and current
source. However, using multiple instruments takes up more rack space than a system with all
these functions in one unit. Three separate instruments also mean three sets of commands to