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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | 12/10/21 | 1015 kB | 3 | Agilent | Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System | |
| 5991-4715EN English _ 2014-08-27 _ PDF 227 KB c20141007 [4].pdf | 5991-4715EN English _ 2014-08-27 _ PDF 227 KB c20141007 [4].pdf | 24/12/19 | Keysight Technologies Materials Measurem | 227 kB | 2 | Agilent | 5991-4715EN English 2014-08-27 PDF 227 KB c20141007 [4] |
| Capacitance Method_252CFlat Plate_252C Liquid_252C Gel_252C Ultra Thin Film_252C Compound Film_252CD | Capacitance Method_252CFlat Plate_252C Liquid_252C Gel_252C Ultra Thin Film_252C Compound Film_252CD | 04/10/21 | 970 kB | 3 | Agilent | Capacitance Method 252CFlat Plate 252C Liquid 252C Gel 252C Ultra Thin Film 252C Compound Film 252CD | |
| 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 13/08/21 | Keysight Technologies Materials Measurem | 935 kB | 1 | Agilent | 5991-4713EN Materials Measurement Dielectric Materials - Application Brief c20140717 [5] |
| 5980-2862EN.pdf | 5980-2862EN.pdf | 22/03/20 | Agilent Solutions for Measuring Permitti | 1536 kB | 3 | HP | 5980-2862EN |
| Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- | 26/07/21 | Keysight Technologies and KEYCOM Corp. P | 1389 kB | 4 | Agilent | Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra- |
| 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 15/09/21 | Keysight Technologies Solutions for Meas | 718 kB | 4 | Agilent | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers |
| 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 19/08/21 | Keysight Technologies Measuring Dielectr | 525 kB | 2 | Agilent | 5991-2171EN Measuring Dielectric Properties using Keysight 2527s Materials Measurement Solutions - B |
| 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf | 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf | 31/08/20 | Keysight Technologies Basics of Measurin | 2840 kB | 1 | Agilent | 5989-2589EN English 2014-05-16 PDF 3.32 MB c20140728 [34] |
| an_380-1.pdf | an_380-1.pdf | 31/01/20 | Dielectric Constant Measurement of Solid | 3530 kB | 0 | HP | an 380-1 |
| English _ 2013-05-16 _ PDF 3.59 MB 5991-2061EN c20140811 [7].pdf | English _ 2013-05-16 _ PDF 3.59 MB 5991-2061EN c20140811 [7].pdf | 29/08/20 | Keysight Technologies Low Frequency RFID | 4280 kB | 1 | Agilent | English 2013-05-16 PDF 3.59 MB 5991-2061EN c20140811 [7] |
| 5991-4714EN Materials Measurement_ Magnetic Materials - Application Brief c20140717 [5].pdf | 5991-4714EN Materials Measurement_ Magnetic Materials - Application Brief c20140717 [5].pdf | 22/11/21 | Keysight Technologies Materials Measurem | 1114 kB | 1 | Agilent | 5991-4714EN Materials Measurement Magnetic Materials - Application Brief c20140717 [5] |
| 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19].pdf | 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19].pdf | 31/08/20 | Keysight Technologies Paving the Way for | 1038 kB | 1 | Agilent | 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19] |
| an_1304-2.pdf | an_1304-2.pdf | 21/02/20 | Time Domain Reflectometry Theory Applica | 132 kB | 0 | HP | an 1304-2 |
| 5991-2803EN Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Pro | 5991-2803EN Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Pro | 05/10/21 | Analysis of Test Coupon Structures for t | 2186 kB | 3 | Agilent | 5991-2803EN Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Pro |
| 5966-4855E Time Domain Reflectometry Theory - Application Note c20140906 [16].pdf | 5966-4855E Time Domain Reflectometry Theory - Application Note c20140906 [16].pdf | 22/12/19 | Keysight Technologies Time Domain Reflec | 916 kB | 6 | Agilent | 5966-4855E Time Domain Reflectometry Theory - Application Note c20140906 [16] |
| Application Note 130 Cyrix III CPU Layout Guidelines for 133 MHz Bus Operation.PDF | Application Note 130 Cyrix III CPU Layout Guidelines for 133 MHz Bus Operation.PDF | 08/09/22 | Application Note 130 Cyrix III CPU Layou | 84 kB | 0 | cyrix | Application Note 130 III CPU Layout Guidelines for 133 MHz Bus Operation |
| Electric Wave Absorber (Material)_252C Return Loss Measurement System Lens Antenna Method_252C Diago | Electric Wave Absorber (Material)_252C Return Loss Measurement System Lens Antenna Method_252C Diago | 08/09/21 | Keysight Technologies and KEYCOM Corp. E | 762 kB | 2 | Agilent | Electric Wave Absorber (Material) 252C Return Loss Measurement System Lens Antenna Method 252C Diago |
| Stone [polymer smd] PVM Series.pdf | Stone [polymer smd] PVM Series.pdf | 17/05/21 | ALUMINUM ELECTROLYTIC CAPACITORS WITH CO | 414 kB | 2 | Stone | [polymer smd] PVM Series |
| Stone [polymer smd] PVX Series.pdf | Stone [polymer smd] PVX Series.pdf | 29/11/21 | ALUMINUM ELECTROLYTIC CAPACITORS WITH CO | 412 kB | 13 | Stone | [polymer smd] PVX Series |